Bayes estimator of process capability index <i>C<sub>pk</sub></i> with a specified prior mean

Matsuura, Shinya

doi:10.1080/03610926.2021.1947508

Cited by 3 publications

(1 citation statement)

References 37 publications

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“…They suggested using a process capability index -𝐶 𝑝𝑘 -as the objective function. Also, (Matsuura, 2021) developed a Bayes estimator of 𝐶 𝑝𝑘 is such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative.…”

Section: Process Capability Analysis For Simple Linear Profiles In Mu...mentioning

confidence: 99%

Process Capability Analysis for Simple Linear Profiles in Multistage Processes

Adibfar,

Noorossana

2024

Pak.j.stat.oper.res.

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When a process is statistically under control, one may be interested in assessing the process performance based on the specification limits provided by the customer. This evaluation is referred to as process capability analysis. Manufacturing operations are often involved with multistage processes, in which the output of a stage is the input of its subsequent stage. This property is known as the cascade property. Existing methods in capability analysis studies are not applicable when a process or product is represented by profiles. This study presents a method to conduct process capability analysis in a multistage process when quality of a product or process is characterized by a simple linear profile. The performance of the proposed method for a two-stage process is evaluated by numerical simulation using an example from the literature. The results indicate that the proposed method eliminates the effect of the cascade property for different shift sizes and autocorrelations.

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Section: Process Capability Analysis For Simple Linear Profiles In Mu...mentioning

confidence: 99%

Process Capability Analysis for Simple Linear Profiles in Multistage Processes

Adibfar,

Noorossana

2024

Pak.j.stat.oper.res.

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Enhancing Lot Sentencing Through a Capability Index‐Based Skip‐Lot Sampling Scheme

Liu,

Wu,

Wei

2024

Quality & Reliability Eng

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An acceptance sampling plan (ASP) is a commonly used tool in quality assurance that allows business partners to make decisions about lot disposition. To enhance the efficiency and applicability of inspection, various ASPs have been constructed to meet different circumstances in practical applications. One of these ASPs is the skip‐lot sampling plan (SkSP), which reduces inspection time and cost for a series of product lots from a supplier with excellent quality records. Based on the structure of the SkSP, we propose an improved variables SkSP that uses a repetitive group sampling (RGS) plan based on the most commonly used capability index Cpk as the reference plan, designated as Cpk‐based SkSP‐RGS. This plan is optimized using a model that ensures the operating characteristic function meets a two‐point condition and minimizes the average sample number (ASN). Additionally, two main performance measures of sampling plans, ASN and discriminatory power, are investigated. The results reveal the superiority of the proposed plan over conventional Cpk‐based sampling plans. Lastly, a case study from the liquid crystal module industry is demonstrated using the proposed plan to show its applicability and practicality.

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Improved process capability assessment through semiparametric piecewise modeling

Costa Soares,

Jerez-Lillo,

Henrique Ferreira

et al. 2024

Journal of Statistical Computation and Simulation

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Bayes estimator of process capability index C_pk with a specified prior mean

Cited by 3 publications

References 37 publications

Process Capability Analysis for Simple Linear Profiles in Multistage Processes

Process Capability Analysis for Simple Linear Profiles in Multistage Processes

Enhancing Lot Sentencing Through a Capability Index‐Based Skip‐Lot Sampling Scheme

Improved process capability assessment through semiparametric piecewise modeling

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Bayes estimator of process capability index Cpk with a specified prior mean

Cited by 3 publications

References 37 publications

Process Capability Analysis for Simple Linear Profiles in Multistage Processes

Process Capability Analysis for Simple Linear Profiles in Multistage Processes

Enhancing Lot Sentencing Through a Capability Index‐Based Skip‐Lot Sampling Scheme

Improved process capability assessment through semiparametric piecewise modeling

Contact Info

Product

Resources

About

Bayes estimator of process capability index C_pk with a specified prior mean