2011
DOI: 10.1118/1.3553408
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Beam hardening effects in grating‐based x‐ray phase‐contrast imaging

Abstract: The evaluated correction algorithm is shown to yield good results for a number of simple test objects and can thus be advocated in medical imaging and nondestructive testing.

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Cited by 57 publications
(57 citation statements)
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“…The spectrum impinging on these soldering point is hardened by the resistors in the upper layer, resulting in lower absorption contrast. Due to the weaker energy dependence of phase shifts (1/ E compared to 1/ E 3 ), phase-contrast images are less sensitive to beam hardening30, which explains the lower contrast reduction of the soldering points under the resistors in the phase image of the chip. This example shows one of the potential benefits of phase contrast X-ray imaging at high energies, which may be useful to identify flaws in multilayered structures such as electronic chips.…”
Section: Resultsmentioning
confidence: 99%
“…The spectrum impinging on these soldering point is hardened by the resistors in the upper layer, resulting in lower absorption contrast. Due to the weaker energy dependence of phase shifts (1/ E compared to 1/ E 3 ), phase-contrast images are less sensitive to beam hardening30, which explains the lower contrast reduction of the soldering points under the resistors in the phase image of the chip. This example shows one of the potential benefits of phase contrast X-ray imaging at high energies, which may be useful to identify flaws in multilayered structures such as electronic chips.…”
Section: Resultsmentioning
confidence: 99%
“…We have also shown, for reference, the theoretical refraction angle at the estimated mean energy of the spectrum (18keV). We do not expect the experimentally acquired results to match this profile due to beam hardening which results from absorption by the wire [25]. The main point of these plots is to show an experimental case where the full TC inversion formula is required for accuracy in order to account for large refraction angles.…”
Section: Examples and Analysismentioning
confidence: 98%
“…The expected refraction angle in Fig. 9 can only be calculated with accurate knowledge of the source and detector spectral responses and the sample absorption [25]. In light of this and in order to further demonstrate the advantages of the TC inversion method we now present some numerical simulations.…”
Section: Examples and Analysismentioning
confidence: 99%
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“…It must be noted that beam-hardening artifacts might affect the quality of the CT reconstruction, especially for large and/or dense samples, similar to conventional absorption-based CT [28]; therefore, adaptation to XPCI of the correction methods developed for conventional CT might be necessary to correct for these effects.…”
Section: Theorymentioning
confidence: 99%