2002
DOI: 10.1109/tns.2002.801505
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Beamtest of nonirradiated and irradiated ATLAS SCT microstrip modules at KEK

Abstract: Nonirradiated and irradiated ATLAS silicon microstrip barrel and endcap modules have been beamtested with 4-GeV/c pions. Pulse shapes confirmed the peaking time of the amplifier to be 22 ns with slight deterioration in the irradiated modules. Median charges saturated around 3.8 fC, both in the nonirradiated and the irradiated modules. Signal/noise ratios, using the noise estimates from the in-situ calibration, were 16 in the nonirradiated ( 150 V) and 10 in the irradiated ( 300 V) barrel modules. No excess com… Show more

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Cited by 14 publications
(4 citation statements)
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“…Whenever the corresponding calibration runs are performed, the mean values of the response-curve ENC or NO at 1 fC for each chip are saved for later analyses. These two noise estimates correlate fairly well chip-by-chip, but ENC values deduced from noise occupancies are sytematically smaller by about 5% [42]. Below, unless specified, 'noise' refers to the ENC value from the response-curve width, and is measured for modules with bias voltage at the normal operating value of 150 V.…”
Section: Noisementioning
confidence: 80%
“…Whenever the corresponding calibration runs are performed, the mean values of the response-curve ENC or NO at 1 fC for each chip are saved for later analyses. These two noise estimates correlate fairly well chip-by-chip, but ENC values deduced from noise occupancies are sytematically smaller by about 5% [42]. Below, unless specified, 'noise' refers to the ENC value from the response-curve width, and is measured for modules with bias voltage at the normal operating value of 150 V.…”
Section: Noisementioning
confidence: 80%
“…An estimated fluence at the innermost part of the SCT is ∼ 2 × 10 14 1-MeV-neutrons/cm 2 (or equivalently ∼ 3 × 10 14 24-GeVprotons/cm 2 ) in ten years of operation. The SCT has been designed to be able to withstand these fluences [8] and its performance has been extensively studied in beam tests using irradiated SCT modules [9].…”
Section: Introductionmentioning
confidence: 99%
“…Whenever the corresponding calibration runs are performed, the mean values of the response-curve ENC or NO at 1 fC for each chip are saved for later analyses. These two noise estimates correlate fairly well chip-by-chip, but ENC values deduced from noise occupancies are sytematically smaller by about 5% [42]. Below, unless specified, 'noise' refers to the ENC value from the response-curve width, and is measured for modules with bias voltage at the normal operating value of 150 V. Figure 13 shows the distributions of chip-averaged response-curve ENC values and noise occupancies at 1 fC as of October 2010 and December 2012 for different module types.…”
Section: Noisementioning
confidence: 61%