1961
DOI: 10.1103/physrev.121.1607
|View full text |Cite
|
Sign up to set email alerts
|

Behavior of Excited Electrons and Holes in Zinc Sulfide Phosphors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
5
0

Year Published

1967
1967
2021
2021

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 21 publications
(7 citation statements)
references
References 24 publications
2
5
0
Order By: Relevance
“…In other words, there is an enhanced TL intensity transfer from low temperature peaks towards high temperature peaks when f decreases. Such a TL intensity transfer was already reported into ZnS:Cu compounds and was assigned to the occurrence of a thermal connection between the traps [16]. Namely, when temperature is raised, a significant portion of the electrons released from S traps may be captured by both I and H traps, while electrons freed from I traps may be only captured by the H traps.…”
Section: Thermoluminescencesupporting
confidence: 64%
“…In other words, there is an enhanced TL intensity transfer from low temperature peaks towards high temperature peaks when f decreases. Such a TL intensity transfer was already reported into ZnS:Cu compounds and was assigned to the occurrence of a thermal connection between the traps [16]. Namely, when temperature is raised, a significant portion of the electrons released from S traps may be captured by both I and H traps, while electrons freed from I traps may be only captured by the H traps.…”
Section: Thermoluminescencesupporting
confidence: 64%
“…S 2 4S 1 indicates that the radiative efficiency in the release process is higher than that in the charging process. Such an effect has also been observed by Shionoya [2] in similar studies conducted in zinc sulfide doped with Cu + ions in an electron trap model. The holes are left at the luminescent centers after the excited electrons are trapped by the trapping centers, and the transition for the holes released to the valence band is responsible for the quenching effect.…”
Section: Article In Presssupporting
confidence: 50%
“…2). Shionoya [2] has assumed that the charging process of the persistent phosphor is accompanied by a luminescent efficiency decrease owing to the quenching effect of the trapping centers. He described a quenching curve which is submerged in the growth of the charging process.…”
Section: Article In Pressmentioning
confidence: 99%
See 1 more Smart Citation
“…Due to electron traps that draw electrons from the vicinity of the excited centers, for example, Zn vacancies or Cu interstitials, a long lifetime component is reported for ZnS as well. [ 48 ] The non‐calcined samples show a more pronounced short lifetime, possibly due to the healing of these electron‐trapping defects by calcination. Additionally, TRPL measurements were conducted after 40 min of UV irradiation at λ = 330 nm (Figure 8b–d).…”
Section: Resultsmentioning
confidence: 99%