2007
DOI: 10.1143/jjap.46.1879
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Behavior of Local Charge-Trapping Sites in La2O3–Al2O3 Composite Films under Constant Voltage Stress

Abstract: An outline of a quantum approach to multi-kink profiles as coherent states in a ferromagnetic chain is given. Relying on the continuum and harmonic approximation the influence of the out-of-plane fluctuations on the stability and dynamics of multi-kink structures in a finite chain is studied and compared with the stability and dynamics of single-kink profiles in an infinite chain. Even in the harmonic approximation, very few modes are diagonal. n e multi-kink structure does not exhibit a 'zero-frequency' Golds… Show more

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Cited by 2 publications
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“…Conductive atomic force microscopy (C-AFM) is a powerful tool for analyzing the local electrical properties of gate dielectric films. [6][7][8] By using C-AFM, we can observe the local leakage current behavior and discuss the current conduction mechanism of Pr-oxide films in the microscopic region. We can also investigate the spatial and time fluctuation of the current conduction in Pr oxide films.…”
Section: Introductionmentioning
confidence: 99%
“…Conductive atomic force microscopy (C-AFM) is a powerful tool for analyzing the local electrical properties of gate dielectric films. [6][7][8] By using C-AFM, we can observe the local leakage current behavior and discuss the current conduction mechanism of Pr-oxide films in the microscopic region. We can also investigate the spatial and time fluctuation of the current conduction in Pr oxide films.…”
Section: Introductionmentioning
confidence: 99%