2022
DOI: 10.1016/j.jmrt.2022.10.056
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Behavior of Sn-3.0Ag-0.5Cu solder/Cu fluxless soldering via Sn steaming under formic acid atmosphere

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Cited by 19 publications
(7 citation statements)
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“…In most power-device manufacturing processes, dies are attached to substrates using Sn-based solders . However, because the melting point of Sn-based solders is low, such as the melting point of 217–219 °C of Sn-3.0Ag-0.5Cu solder, these solders tend to experience remelting and serious stability issues at high operating temperatures exceeding 250 °C. , Therefore, the development of die attachment materials that can endure high operating temperatures is in great demand.…”
Section: Introductionmentioning
confidence: 99%
“…In most power-device manufacturing processes, dies are attached to substrates using Sn-based solders . However, because the melting point of Sn-based solders is low, such as the melting point of 217–219 °C of Sn-3.0Ag-0.5Cu solder, these solders tend to experience remelting and serious stability issues at high operating temperatures exceeding 250 °C. , Therefore, the development of die attachment materials that can endure high operating temperatures is in great demand.…”
Section: Introductionmentioning
confidence: 99%
“…The peculiar mesh-like structure of Cu porous can improve the contact area between Cu and Sn, enhancing the performance of the solder joint [5] . Despite previous studies on Cu porous as a sandwich structure intermediate layer, there has been no direct comparison of intermetallic compound (IMC) shear strength between SAC and Sn58Bi [6,7] . The study aimed to examine the impact of two solder types on the bonding strength of TLP joints by applying Sn58Bi and SAC to the top and lower surfaces of the Cu porous layer in a sequential manner.…”
Section: Introductionmentioning
confidence: 99%
“…The eutectic Sn-58Bi alloy performs good wettability with bonding metallic substrates [ 23 , 24 , 25 , 26 ]. The eutectic Sn-58Bi alloy contains precipitated Bi that creates numerous phase boundaries and serves as a secondary phase within the Sn matrix [ 27 , 28 , 29 ].…”
Section: Introductionmentioning
confidence: 99%