1993
DOI: 10.1063/1.1143913
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Bench top Fourier transform infrared based instrument for simultaneously measuring surface spectral emittance and temperature

Abstract: A bench top instrument has been constructed which allows for the measurements of radiance, directional-hemispherical reflection, and directional-hemispherical transmission from materials at elevated temperatures from 100 to over 2000 °C. The instrument measures these radiative properties over a wide spectral range, in the near- and mid-IR, from 12 500 to 500 cm−1 (0.8–20 μm). These measurements are then processed to determine the spectral emittance of the material and the temperature at the point of measuremen… Show more

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Cited by 62 publications
(29 citation statements)
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“…Using optical methods, it is usually difficult to do absolute thermal conductivity measurements temperature rise at the surface causes either reflectance change, [197][198][199] emittance change, [200][201][202][203] absorptance change, 204 photoacoustic signal change, 205 thermal expansion on the sample surface or in the surrounding media. [206][207][208] Either the amplitude or phase signals can be used to extract thermal properties of thin 35 films and interfaces.…”
Section: 5 Optical Methodsmentioning
confidence: 99%
“…Using optical methods, it is usually difficult to do absolute thermal conductivity measurements temperature rise at the surface causes either reflectance change, [197][198][199] emittance change, [200][201][202][203] absorptance change, 204 photoacoustic signal change, 205 thermal expansion on the sample surface or in the surrounding media. [206][207][208] Either the amplitude or phase signals can be used to extract thermal properties of thin 35 films and interfaces.…”
Section: 5 Optical Methodsmentioning
confidence: 99%
“…Finally, some emissivity data for Inconel 600, Inconel X and Haynes 230 are given in Refs. [9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…The hemispherical reflectance has been measured by various techniques [7][8][9][10][11][12][13]. In the field of thermal engineering, the hemispherical reflectance has been measured mainly by an integrating sphere technique [7].…”
Section: Idea For New Spectrophotometer Systemmentioning
confidence: 99%