2017
DOI: 10.1039/c7ra02734f
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Benchmark characterization of the thermoelectric properties of individual single-crystalline CdS nanowires by a H-type sensor

Abstract: A precision H-type sensor method has been developed to measure the thermoelectric performance of individual single-crystalline CdS nanowires for the first time.

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Cited by 5 publications
(6 citation statements)
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“…图 2: (a)基于场效应晶体管对二维半导体热电性质测量器件示意图 [24] ; (b) 利用电子双 层结构离子液体晶体管对二维材料的热电性质测量器件示意图 [25] ;( c)悬空热桥法器件示 意图 [26] ; (d)利用 H 型方法测量样品的塞贝克系数示意图 [27] 。 Fig2. (a) Schematic image of device for measuring thermoelectric property based on field effect transistor (FET).…”
Section: 热电性能的测量原理unclassified
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“…图 2: (a)基于场效应晶体管对二维半导体热电性质测量器件示意图 [24] ; (b) 利用电子双 层结构离子液体晶体管对二维材料的热电性质测量器件示意图 [25] ;( c)悬空热桥法器件示 意图 [26] ; (d)利用 H 型方法测量样品的塞贝克系数示意图 [27] 。 Fig2. (a) Schematic image of device for measuring thermoelectric property based on field effect transistor (FET).…”
Section: 热电性能的测量原理unclassified
“…Reproduced with permission. [27] Copyright 2017, The Royal Society of Chemistry. [10,28] 。至此,可以得出热 电压和温度差,即可算出塞贝克系数的大小。 同时,利用这种方法还可以测量样品的电导率,1-4 电极可以用作四端法进 行测量样品电导率和迁移率 [29] 。四端法由于可以避免接触电阻和肖特基势垒带 来的影响,从而有能力获得更加精确的结果 [30] 。例如,在 80 K 温度下,四端法 测量的双层 MoS 2 迁移率相比两端法的测量结果提高了一个数量级,从而实现对 样品通道本征性质的测量 [28,[31][32][33][34]…”
Section: 热电性能的测量原理unclassified
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“…This method measures temperature more accurately. Wang et al [34] measured the thermoelectric properties of a single-crystal cadmium sulfide nanowire using the H-type method. The Seebeck coefficient, thermal conductivity, and electrical conductivity were measured on the same sample under test by simply changing the external circuit.…”
Section: Introductionmentioning
confidence: 99%
“…A number of recently developed techniques enable the growth of NWs of various materials with different diameters, cross sections (square, hexagon, triangle), crystal orientations, dopings, surface roughness as well as core-shell structures [27][28][29][30]. Precise control of the physical and chemical properties of the NWs enables the effective decoupling of electric and thermal conductivities, thus achieving ZT one or two orders of magnitudes larger than in their bulk counterparts, as was shown in Si [17,18], ZnO [31], Bi 2 Te 3 [32,33], SiGe [34], CdS [35] and SnSe [36] NWs. The coreshell nanostructuring also contributes to lower the thermal conductivity of Bi 2 Te 2 S-Bi 2 S 3 , Bi 2 Te 3 -Bi 2 S 3 , Ge-Si, and PbTe-PbSe NWs due to the scattering of phonons at the heterojunction (see Ref.…”
Section: Introductionmentioning
confidence: 99%