1995
DOI: 10.1116/1.588186
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Benign making of sharp tips for STM and FIM: Pt, Ir, Au, Pd, and Rh

Abstract: Easy and reproducible method for making sharp tips of Pt/IrSharp tips for various modern microscopies, such as field-ion microscopy ͑FIM͒ and scanning tunneling microscopy ͑STM͒, can be prepared by electropolishing in solutions which are relatively innocuous for the environment as well as the researcher, compared to the often hazardous solutions still in widespread use. We have made measurements of polishing times as a function of solution and voltage parameters and we report conditions for electropolishing sh… Show more

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Cited by 75 publications
(39 citation statements)
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“…Our belief is based on the difference in ionization potential between hydrogen and krypton. Owing to the fact that the value of the ionization potential of krypton is lower than that of hydrogen [11] we can expect that the surface complexes formed in the course of palladium exposure to hydrogen do not undergo desorption during krypton-FIM imaging.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Our belief is based on the difference in ionization potential between hydrogen and krypton. Owing to the fact that the value of the ionization potential of krypton is lower than that of hydrogen [11] we can expect that the surface complexes formed in the course of palladium exposure to hydrogen do not undergo desorption during krypton-FIM imaging.…”
Section: Resultsmentioning
confidence: 99%
“…The field ion specimen was prepared from a 0.1 mm palladium wire of 99.99% purity by means of ac (≈ 5 V) electropolishing in 38% solution of HCl in glycerine [11]. Before experiment, the specimen surface was shaped to an atomically smooth end-form by using both annealing at 1000 K and field evaporation.…”
Section: Methodsmentioning
confidence: 99%
“…Atom probe samples were prepared by electropolishing using a solution of 50% CaCl 2 by volume in water for the first step, starting at about 35 Vac with a graphite counter electrode [8]. Then, the samples were fabricated to have the curvature radius of less than 100 nm by focused ion beam (FIB, SMI3050, SIINT).…”
Section: Experimental a The Transformation Of Surface Compositiomentioning
confidence: 99%
“…The temperature of outgasing was high enough for a distinct evaporation of iridium. Emitters were prepared using Melmed's procedures [10]. The Jr emitter tip was cleaned by the resistive heating of the emitter loop assembly.…”
Section: Apparαtusmentioning
confidence: 99%