2020
DOI: 10.1088/1361-6528/ab71ba
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Berezinskii–Kosterlitz–Thouless transition in an Al superconducting nanofilm grown on GaAs by molecular beam epitaxy

Abstract: We have performed extensive transport experiments on a 4 nm thick aluminum (Al) superconducting film grown on a GaAs substrate by molecular beam epitaxy (MBE). Nonlinear current-voltage (I-V ) measurements on such a MBE-grown superconducting nanofilm show that V∼I 3 , which is evidence for the Berezinskii-Kosterlitz-Thouless (BKT) transition, both in the low-voltage (T BKT ≈1.97 K) and high-voltage regions (T BKT ≈2.17 K). In order to further study the two regions where the I-V curves are BKT-like, our e… Show more

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Cited by 4 publications
(1 citation statement)
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“…This behavior suggests the presence of Berezinskii-Kosterlitz-Thouless (BKT) transition, which was previously reported in the thermal-driven evolution of 2D superconductivity at finite temperatures 34 , 35 . Although the BKT transition typically occurs in materials with large sheet resistance 36 , this is not an exclusive requirement considering the relatively low sheet resistance in our case ( ) and in other 2D superconductors 35 , 37 , 38 . The BKT transition is further validated by the temperature induced vortices/antivortices unbinding model 38 , providing reasonable fittings of the observed R - T curves using the Halperin-Nelson formula 34 (Supplementary Fig.…”
Section: Resultsmentioning
confidence: 95%
“…This behavior suggests the presence of Berezinskii-Kosterlitz-Thouless (BKT) transition, which was previously reported in the thermal-driven evolution of 2D superconductivity at finite temperatures 34 , 35 . Although the BKT transition typically occurs in materials with large sheet resistance 36 , this is not an exclusive requirement considering the relatively low sheet resistance in our case ( ) and in other 2D superconductors 35 , 37 , 38 . The BKT transition is further validated by the temperature induced vortices/antivortices unbinding model 38 , providing reasonable fittings of the observed R - T curves using the Halperin-Nelson formula 34 (Supplementary Fig.…”
Section: Resultsmentioning
confidence: 95%