ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) 2021
DOI: 10.1109/essderc53440.2021.9631780
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Bias Generation and Calibration of CMOS Charge Qubits at 3.5 Kelvin in 22-nm FDSOI

Imran Bashir1,
Dirk Leipold2,
Mike Asker3
et al.
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