Biaxial anisotropic sample design and rectangular to square waveguide material characterization system

Knisely, Alexander; Havrilla, Michael J.; Collins, P.J.

doi:10.1109/metamaterials.2015.7342445

Cited by 9 publications

(2 citation statements)

References 4 publications

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“…The unit cell, shown in Fig. 3, is based on a material with a single unit occlusion similar to the one found in [35]. The structure material has a relative permittivity of ¼ 2:86 þ 0:04i and permeability ¼ 1.…”

Section: Anisotropic Samples Aligned With ẑmentioning

confidence: 99%

Permittivity and Permeability Tensor Extraction Technique for Arbitrary Anisotropic Materials

et al. 2015

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Computing the permittivity and permeability of complex materials has previously relied on a series of simplifying assumptions to enable analysis. The most restricting requirement is that the optical axes of the material must align with the laboratory frame of reference. This requirement cannot be met for a large group of materials, including crystalline structures and metamaterials such as tilted nanorods. Currently, designing the optical characteristics of these structures would require ellipsometric analysis, which uses an error-correction-based technique. Here, a new technique built upon the underlying physics of ellipsometry is proposed to extract arbitrary permittivity and permeability tensors using a set of off-axis measurements. This new permittivity and permeability tensor extraction technique allows all 18 elements of the permittivity and permeability tensors to be nonzero and extracts them, given a set of reflectance and transmittance measurements. Several materials are analyzed here, including a) an isotopic plane of known permittivity, b) an anisotropic aligned structure, and c) a tilted-nanorod-based sample that cannot be measured using traditional methodologies. The isotropic plane shows very low error ðG 10 À4 %Þ in the x and y tensor measurements and around 1% error in the z tensor measurement at higher (metallic) permittivities. The aligned structure's characteristics are compared to measurements made with traditional techniques and show excellent agreement between the techniques. The tilted nanorod characteristics are analyzed and used to predict the reflection and transmission coefficients at other angles. The predictions compare very well with the computational electromagnetic simulations, showing at most 5% error over the range examined.

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Section: Anisotropic Samples Aligned With ẑmentioning

confidence: 99%

Permittivity and Permeability Tensor Extraction Technique for Arbitrary Anisotropic Materials

et al. 2015

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“…During the last few decades, there have been extensive studies on the scattering of waveguide transitions for many applications such as transformers [1], filters [2], and power dividers [3]. Moreover, a tapered waveguide can be used in a measurement system to characterize the electromagnetic properties of biaxial anisotropic materials [4].…”

Section: Introductionmentioning

confidence: 99%

Analysis of a Tapered Rectangular Waveguide for V to W Millimeter Wavebands

Lee

Son

Kwon

et al. 2018

J Electromagn Eng Sci

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An electromagnetic boundary-value problem of a tapered rectangular waveguide is rigorously solved based on eigenfunction expansion and the mode-matching method. Scattering parameters of the tapered rectangular waveguide are represented in a series form and calculated in terms of different rectangular waveguide combinations. Computation is performed to analyze reflection and transmission characteristics. Conductor loss by surface current density is also calculated and discussed.

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