2018
DOI: 10.1021/acsaem.8b00060
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Bifunctional Hydroxylamine Hydrochloride Incorporated Perovskite Films for Efficient and Stable Planar Perovskite Solar Cells

Abstract: Research on the addition of suitable materials into perovskite film for improved quality is important to fabricate efficient and stable perovskite solar cells. An attempt to enhance the quality of perovskite is performed by incorporation of a bifunctional hydroxylamine hydrochloride (HaHc) into pristine perovskite solution. On the one hand, the chloride ion in HaHc changes the crystallization kinetic and defect state of the perovskite film and a high-quality perovskite film with larger grain size and lower def… Show more

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Cited by 84 publications
(61 citation statements)
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“…To investigate the effect of NbF 5 additive on the electronic property of perovskite film, the space charge–limited current technique is applied to evaluate quantitatively the electron trap‐state density using a device structure of fluorine‐doped tin oxide (FTO)/TiO 2 /perovskite(NbF 5 )/[6,6]‐phenyl C61 butyric acid methyl ester (PCBM)/Ag . Figure a,b shows the typical dark current–voltage characteristics of the perovskite without and with NbF 5 additive, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…To investigate the effect of NbF 5 additive on the electronic property of perovskite film, the space charge–limited current technique is applied to evaluate quantitatively the electron trap‐state density using a device structure of fluorine‐doped tin oxide (FTO)/TiO 2 /perovskite(NbF 5 )/[6,6]‐phenyl C61 butyric acid methyl ester (PCBM)/Ag . Figure a,b shows the typical dark current–voltage characteristics of the perovskite without and with NbF 5 additive, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…The typical dark J – V characteristics of the electron‐only devices are shown in Figure S7, Supporting Information. The trap densities ( n trap ) are calculated by the equation of n trap = (2 V TFL εε 0 )/( eL 2 ), where V TFL is the trap‐filled limit voltage, ε and ε 0 are the relative dielectric constant for CsPbI 2 Br perovskite and the vacuum permittivity, respectively. e is the electron charge and L is thickness of the CsPbI 2 Br perovskite film .…”
Section: Resultsmentioning
confidence: 99%
“…To investigate the effect of CsAc alloying on the electron trap density of perovskite film, the J–V characteristics of electron‐only devices (glass/fluorine‐doped tin oxide (FTO)/TiO 2 /perovskite/PCBM/Ag) are measured, and the trap densities are estimated by the space charge limited current (SCLC) technique . The trap‐state density ( n trap ) is calculated using the equation n trap = (2 εε 0 V TFL )/( eL 2 ), where ε is relative dielectric constant of perovskite and ε 0 is the vacuum permittivity.…”
Section: Resultsmentioning
confidence: 99%