2014
DOI: 10.1002/adma.201400127
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Bipolar Electrochemical Mechanism for Mass Transfer in Nanoionic Resistive Memories

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Cited by 99 publications
(85 citation statements)
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References 31 publications
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“…Up to this point, the behaviour of Ag nanoparticles in SiO x N y is similar to previous observations, which have been interpreted as electrochemical reactions at effectively bipolar electrodes [21][22][23][24][25][26] . We next turned off the power at 5.0s to observe the spontaneous relaxation, which is critical for understanding the dynamics of these devices, but has not been previously reported to the best of our knowledge.…”
supporting
confidence: 73%
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“…Up to this point, the behaviour of Ag nanoparticles in SiO x N y is similar to previous observations, which have been interpreted as electrochemical reactions at effectively bipolar electrodes [21][22][23][24][25][26] . We next turned off the power at 5.0s to observe the spontaneous relaxation, which is critical for understanding the dynamics of these devices, but has not been previously reported to the best of our knowledge.…”
supporting
confidence: 73%
“…S1-S2). These devices are similar to electrochemical metallization memory (ECM) [21][22][23][24][25][26] cells in terms of utilizing mobile species of noble metals, but they differ substantially in terms of the structural symmetry and operating voltage polarities, metal concentration and profile, and transient switching behaviour. An applied voltage above an apparent threshold abruptly switched the device to a conductance state limited by an external compliance current (Fig. 1b).…”
mentioning
confidence: 99%
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“…Being a poor Ag ion conductor and unable to dissolve Ag chemically, HfOx makes Ag + easy to be chemically reduced within the dielectrics due to low ion mobility and low redox reaction rate, yielding the observed cone shaped Ag filament which grows from the Ag source rather than having Ag deposition on the opposite anode. [47,48] However, neither of the protrusions completely bridged the dielectric between the top and bottom electrodes, which is different from the behavior typically observed in CBRAM [46,48,49] . The incomplete bridging was further verified by EDS line scans of the Ag peak along the white dashed lines shown in Figure 4(e), which also showed a clear narrowing of the dielectric layer thickness.…”
Section: Resultscontrasting
confidence: 43%
“…37 The inferred growth direction of Cu filament in Cu/ZnS/Pt is similar to that in oxide-based ECM cells. 17,[37][38][39][40][41] The formation of the Cu filament may result from the bipolar electrochemical mass transfer of Cu nanoclusters in ZnS. 17,41 As mentioned previously, the As 2 S 3 :Ag-, 33 GeSe:Ag-, 34 GeS:Cu-, 35 and Ag 2 S-based (Ref.…”
Section: Resultsmentioning
confidence: 99%