2016
DOI: 10.1166/sam.2016.2700
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Bipolar Resistive Switching Characteristics of TaO<SUB>2</SUB> RRAM

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Cited by 2 publications
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“…2 In response, some types of NVMs have been investigated. [3][4][5][6][7][8][9][10][11][12][13] Accordingly, resistive random-access memory (RRAM) devices have attracted great attention. RRAM exhibit advantageous properties such as simple structure, low power consumption, high switching speed, and high integrating density.…”
Section: Introductionmentioning
confidence: 99%
“…2 In response, some types of NVMs have been investigated. [3][4][5][6][7][8][9][10][11][12][13] Accordingly, resistive random-access memory (RRAM) devices have attracted great attention. RRAM exhibit advantageous properties such as simple structure, low power consumption, high switching speed, and high integrating density.…”
Section: Introductionmentioning
confidence: 99%
“…However, with the development of integrated circuits fabrication technologies and the size scaling down of semiconductor components, traditional floating gate memories fabrication had reached their physical limitations. [1][2][3] In order to solve this topic, some NVMs such as ferroelectric random access memories (FeRAMs), [4][5][6] phase change random access memory (PCRAMs), [7][8][9][10] magnetoresistive random access memories (MRAMs), [11][12][13][14] and resistive random access memories (RRAMs) [15][16][17][18][19] have been investigated. Among these memories, RRAM device has attracted considerable attentions for its amazing characteristics, like casual device structure, low operating power consumption, high switching speed, and high integrating density, make it possible for RRAM to be the next generation NVM.…”
mentioning
confidence: 99%