2002
DOI: 10.1002/1521-396x(200208)192:2<441::aid-pssa441>3.0.co;2-u
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Bismuth a New Surfactant or Contact for GaN Films Grown by Molecular Beam Epitaxy

Abstract: We have investigated the influence of an additional bismuth flux during growth on the properties of GaN films prepared by plasma-assisted molecular beam epitaxy. A wide range of bismuth fluxes have been used, at the highest Bi flux this was larger than the flux of Ga. X-ray and photoluminescence studies demonstrate that the structural quality and optical properties of the GaN films grown at $800 C are practically unchanged. X-ray and Auger studies indicated that the concentration of Bi in the bulk of the films… Show more

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Cited by 8 publications
(5 citation statements)
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“…[10][11][12] In addition, Bi in group III-V semiconductors has been used as a surfactant during growth to improve surface morphology. 13,14 Given the electronegativity, N ͑3.0͒ and Bi ͑1.8͒, as well as atomic radius, N ͑75 pm͒ and Bi ͑155 pm͒, mismatches are the largest among all group V elements, a dramatically different electronic band structure is expected to result from an N-rich GaN 1−x Bi x alloy. 15 A wide variety of crystalline semiconductor alloys have been applied to a range of technologies but silicon-based alloys have dominated the application of amorphous semiconductors.…”
mentioning
confidence: 99%
“…[10][11][12] In addition, Bi in group III-V semiconductors has been used as a surfactant during growth to improve surface morphology. 13,14 Given the electronegativity, N ͑3.0͒ and Bi ͑1.8͒, as well as atomic radius, N ͑75 pm͒ and Bi ͑155 pm͒, mismatches are the largest among all group V elements, a dramatically different electronic band structure is expected to result from an N-rich GaN 1−x Bi x alloy. 15 A wide variety of crystalline semiconductor alloys have been applied to a range of technologies but silicon-based alloys have dominated the application of amorphous semiconductors.…”
mentioning
confidence: 99%
“…Fitouri et al reported the segregation of Bi-containing islands on the surface of GaAs 1-x Bi x grown by MOVPE at low temperature [20]. Moreover, it was reported that Bi is not incorporated in GaN matrix [6,7]. Therefore, this relative reduction <R> appears to be related to a Bi segregation on the GaN surface, which is accentuated by increasing the Bi amount in the gas phase.…”
Section: Resultsmentioning
confidence: 96%
“…Bi has been used previously as a surfactant for the growth of GaAs, In x Ga 1-x As [3],GaN x As 1-x [4]and GaInP [5]. Recently, Bi has been used as a surfactant for the growth of GaN grown at 800 °C by molecular beam epitaxy (MBE) [6].…”
Section: Introductionmentioning
confidence: 99%
“…12 In previous work on GaN epitaxial growth, bismuth has been used as a surfactant to improve surface morphology. 13 The difference in electronegativity and atomic radii between N (3.0 eV; 75 pm) and Bi (1.8 eV; 155 pm) of 66 and 106%, respectively, is the largest among all group V elements, thus making a III-V alloy of GaNBi even more difficult to synthesize than GaNAs. 14 Because of the high electronegativity of nitrogen, the valence band (VB) of GaN is at a low energy with respect to vacuum.…”
Section: Introductionmentioning
confidence: 99%