Bismuth as a buffer layer for metal contact with silicon carbide studied by In situ photoelectron spectroscopy

Geng, Xiangrui; Ding, Yishui; Duan, Sisheng; Chen, Wei

doi:10.1016/j.susc.2024.122530

Surface Science

2024

DOI: 10.1016/j.susc.2024.122530

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Bismuth as a buffer layer for metal contact with silicon carbide studied by In situ photoelectron spectroscopy

Xiangrui Geng,

Yishui Ding,

Sisheng Duan

et al.

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Bismuth as a buffer layer for metal contact with silicon carbide studied by In situ photoelectron spectroscopy

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References 48 publications

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