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Быков, В. А.; Медведев, Б. К.; Saunin, S. A.; Sokolov, D. Yu.

doi:10.1023/a:1020491126206

Cited by 2 publications

(1 citation statement)

References 3 publications

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“…The importance of metrological measurements with atomic force microscopy has especially increased in recent years. An AFM probe is the most important part of any atomic force microscope [1]. The reliability and accuracy of metrological measurements depend to a great extent on how accurately the characteristics of the probe are determined while preparing for an exper iment.…”

Section: Introductionmentioning

confidence: 99%

Measuring AFM cantilever stiffness from a thermal noise spectrum

Malovichko

2013

Bull. Russ. Acad. Sci. Phys.

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The problem of AFM cantilever calibration from a thermal noise spectrum is considered. A large volume of preliminary work is required to use this method, along with consideration of numerous factors. Use of a synchronous detector allowed us to reduce the requirements for the measuring system and increase the accuracy of spring constant measurement. The respective experimental results are presented.

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Section: Introductionmentioning

confidence: 99%

Measuring AFM cantilever stiffness from a thermal noise spectrum

Malovichko

2013

Bull. Russ. Acad. Sci. Phys.

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Versatile system for the temperature-controlled preparation of oxide crystal surfaces

Pieper

Lammers

Tröger

et al. 2012

Review of Scientific Instruments

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We present a versatile system for the preparation of oxide crystal surfaces in the ultra-high vacuum (UHV) at temperatures up to 1300 K. Thermal treatment is accomplished by direct current heating of a tantalum foil in contact with the oxide sample. The sample temperature is measured by a thermocouple at a position close to the crystal and its reading is calibrated against the surface temperature determined by a second thermocouple temporarily attached to the surface. The design of the sample holder is based on a transferable plate originally developed for a commercial UHV scanning probe microscope. The system is, however, also suitable for the use with electron spectroscopy or electron diffraction based surface analytical techniques. We present results for the high-temperature preparation of CeO(2)(111) surfaces with atomically flat terraces exhibiting perfect atomic order and cleanliness as revealed by non-contact atomic force microscopy (NC-AFM) imaging. NC-AFM imaging is, furthermore, used to demonstrate the temperature-controlled aggregation of gold atoms on the CeO(2)(111) surface and their evaporation at high temperatures.

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Cited by 2 publications

References 3 publications

Measuring AFM cantilever stiffness from a thermal noise spectrum

Measuring AFM cantilever stiffness from a thermal noise spectrum

Versatile system for the temperature-controlled preparation of oxide crystal surfaces

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