Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits

Abstract

Quantum reversible circuit is a new emerging technology attracting the researchers. A reversible circuit is composed of reversible gates. One example of reversible gate is Toffoli gate. A Toffoli gate (also known as [Formula: see text]-CNOT) has two components — the control and the target. Initially, stuck-at fault and other fault models were used for modeling defects in quantum reversible circuits. Later, a new fault model known as missing gate fault model was introduced, which is more effective in capturing the errors in quantum reversible circuit. Boolean Difference is already a known technique to detect stuck-at faults in conventional CMOS circuit. In this paper, Boolean Difference method is applied to derive the test set for detecting each stuck-at fault and missing gate fault in a reversible circuit. Then an optimization algorithm is used to derive an optimal test set, which will detect all possible faults in a circuit. The method is valid also for other fault models.

Design‐for‐testability for reversible logic circuits based on bit‐swapping

“…Several researchers [9–36] have studied the problem of fault modelling and testing of reversible logic circuits. While the stuck‐at fault model is widely used for conventional logic circuits, newer models such as single missing‐gate fault (SMGF), repeated‐gate fault (RGF), partial missing‐gate fault (PMGF) or multiple missing gate fault (MMGF), have been found to be more suitable for representing physical failures or defects in reversible circuits implemented with different quantum technologies [9, 15, 16].…”

A new online testing technique for reversible circuits

“…We follow the fault models as described in the literature as fruitful to capture physical defects in quantum reversible circuits [4, 9, 11, 13]. Based on these models, several test strategies are described in the existing literature [13–34]. However, with changing technology, these fault models are likely to be changed.…”