“…According to Figure S1a, four weak diffraction peaks at 28.5, 33.0, 45.9, and 56.3° correspond to the (111), (200), (220), and (311) planes of cubic CeO 2 (JCPDS 34-0394), respectively . In Figure S1b, three diffraction peaks at 23.3, 34.3, and 60.6° are well matched with the (101), (015), and (110) planes of Ni(OH) 2 (JCPDS 38-0715) . When the Ce species was added into the prepared sample, several broad and weak diffraction peaks are observed (22.6, 33.2, and 59.6°), which could be classified as the phase of Ni(OH) 2 ; no obvious diffraction peaks of CeO 2 appeared in 14%Ce-Ni(OH) 2 , demonstrating that Ce was implanted as the dopant atom.…”