1999
DOI: 10.1017/s143192760001792x
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Boron Substrates for Particulate X-Ray Microanalysis

Abstract: Sample substrates for x-ray microanalysis of particles should be chemically simple and composed of low atomic number elements. Substrates meeting these requirements will generate a minimum number of low energy x-ray peaks that should not interfere with spectra generated by the particles of interest. Elemental carbon fulfills these requirements and carbon planchets are used for the majority of work involving x-ray microanalysis of particles. When particles of interest are carbonaceous, alternate substra… Show more

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Cited by 3 publications
(2 citation statements)
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“…As an alternative, elemental boron and its oxide are not significantly toxic, although its x-ray peak at 185 eV is detectable with high performance EDS systems. Boron is extremely hard, and a highly polished surface can be produced with an appropriate polishing protocol [ 16 ].…”
Section: X-ray Microanalysis In Vpsem-esem: Influence Of the Specimentioning
confidence: 99%
“…As an alternative, elemental boron and its oxide are not significantly toxic, although its x-ray peak at 185 eV is detectable with high performance EDS systems. Boron is extremely hard, and a highly polished surface can be produced with an appropriate polishing protocol [ 16 ].…”
Section: X-ray Microanalysis In Vpsem-esem: Influence Of the Specimentioning
confidence: 99%
“…It is of sufficient purity that it does not produce any interfering peaks in the EDS spectrum outside of carbon K. As many specimens are carbon coated for conventional SEM and EDS to reduce charging, the contribution of carbon to the EDS spectrum is often ignored. In cases where carbon was of interest by EDS, these substrates would be unsuitable and beryllium or boron substrates (Windsor et al ., 1999) would be more appropriate.…”
Section: Resultsmentioning
confidence: 99%