1968
DOI: 10.1103/physrev.176.993
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Bound-Exciton, Free-Exciton, Band-Acceptor, Donor-Acceptor, and Auger Recombination in GaAs

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Cited by 239 publications
(95 citation statements)
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“…The GaAs edge is observed in all the ensembles at E GaAs = 1.521 eV together with an acceptor level at E = 1.481 eV. 19 The reference InAs ensemble WL absorption edge is 1.423 eV. The introduction of a low-pressure Sb exposure step (samples B and C) before GaAs capping results in a 12-meV blueshift in the WL absorption resonance.…”
Section: Resultsmentioning
confidence: 97%
“…The GaAs edge is observed in all the ensembles at E GaAs = 1.521 eV together with an acceptor level at E = 1.481 eV. 19 The reference InAs ensemble WL absorption edge is 1.423 eV. The introduction of a low-pressure Sb exposure step (samples B and C) before GaAs capping results in a 12-meV blueshift in the WL absorption resonance.…”
Section: Resultsmentioning
confidence: 97%
“…3(b) shows PL spectra of samples with altered Mgconcentrations (1.1%, 1.86%, and 2.8%) but grown at the same temperature, 750 C. These results imply that the FX emission gains PL intensity relative to the DX emission as the Mg-concentration increases. 28,29 In order to draw conclusions on the origin of the FX and DX in the ZnMgO band edge emission region, Figure 4 shows the PL and SPL spectra of the sample with a Mgconcentration of 0.84% (Z07). With the excitation resonant with either the DX peak in ZnO or the DX in ZnMgO, we can clearly identify the LO-phonon-replica related to the donor bound exciton in both ZnO and ZnMgO.…”
Section: Resultsmentioning
confidence: 99%
“…Alongside this redistribution, five distinct new lines appear in the spectra after irradiation with a dose of 10 16 cm À2 (w0 at 1.0325 eV, w1 at $1.0215 eV, w2 at $1.0102 eV, w3 at $0.9909 eV, and w2 LO at $0.98 eV). These lines become even more prominent once the dose increases further as shown in Fig.…”
Section: B Pl Emission From Irradiated Materialsmentioning
confidence: 99%
“…1 A specific advantage of CuInSe 2 -based PV devices is their exceptionally high tolerance to radiation. Measurements of the principal solar cell parameters after irradiation demonstrate almost total insensitivity of the conversion efficiency to high-energy electrons up to doses of 10 16 cm À2 . 2,3 Investigations of Cu(In,Ga)Se 2 -based solar cells irradiated with higher doses of MeV electrons confirmed a considerable stability of their performance.…”
Section: Introductionmentioning
confidence: 99%
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