1993
DOI: 10.1115/1.2910764
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Boundary Conditions for an Evaporating Thin Film for Isothermal Interfacial Conditions

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Cited by 10 publications
(4 citation statements)
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“…The efTect or an electrostatic field on a thin liquid film between the adsorbed film and the meniscus or an evaporating interrace is studied by extending the theoretical treatment developed by Chebaro et al (1992Chebaro et al ( , 1994 Chebaro and Hallinan (1993). The rrame or rererence is considered in rectangular coordinates with the x-axis along the wall and the y-axis normal to the wall as depicted in Figure I, where x = 0 at the connection or the adsorbed film with the thin lilm .…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…The efTect or an electrostatic field on a thin liquid film between the adsorbed film and the meniscus or an evaporating interrace is studied by extending the theoretical treatment developed by Chebaro et al (1992Chebaro et al ( , 1994 Chebaro and Hallinan (1993). The rrame or rererence is considered in rectangular coordinates with the x-axis along the wall and the y-axis normal to the wall as depicted in Figure I, where x = 0 at the connection or the adsorbed film with the thin lilm .…”
Section: Discussionmentioning
confidence: 99%
“…AdditjonaJly, evaporation from the extended meniscus in a thin liquid film has also be widely investigated theoretically and experimentally (Potash andWayner. 1972, Edwards et 'II., 1974;Wa yner et aI., 1976;Renk et aI., 1978;Holm and Goplen, 1979;Moosma n and Homsy, 1980;Truong and Wa yneI', 1987;Mirzlllnoghadam and Catton, 1988;Wa yner, 1989Wa yner, , 1994; Yu a nd C~lrey, 1990;Tao and Kaviany, 1991 ;Dussan et aI., 1991 ;Stephan and Busse, 1992;Swanson and Peterson, 1994;Schonberg and Wa yner, 1992;Chebaro et a I., 1992Chebaro et a I., , 1993Chebaro et a I., , 1994Chebaro and Hallinan, 1993;Moctar et aI., 1993, Dasgupta et aI., 1993Brown et aI., 1993, Swanson andHerdt , 1992;Khrustalev and Faghri, 1995;Kim and Wayner, 1996;Ha and Peterson. 1998;Voinov, 1998;Hopkins et aI., 1999;Pismen et al.…”
Section: Introductionmentioning
confidence: 99%
“…The evaporative heat transfer coefficient is influenced by the following factors [1]: 1) the thermal resistance from the evaporator wall to the liquid-vapor interface, 2) the wick structure characteristics (geometry, thermal conductivity, and permeability), 3) the working fluid transport properties, 4) the location of meniscus in the wick at various imposed heat fluxes, and 5) the inlet temperature to the evaporator. The heat transfer and fluid flow in these devices are analyzed at different scales: 1) the microscale, which encompasses the extended evaporating meniscus thin-film region [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16]; 2) the pore scale, which encompasses the bulk meniscus region with a comprehensive model of the evaporating thin film and intrinsic bulk meniscus [17][18][19][20][21]; 3) the wick scale, which encompasses the entire porous medium [1,[22][23][24][25][26][27][28][29][30][31][32][33][34]; and 4) the system scale, which encompasses the whole loop [35][36][37][38]. In this paper, the effect of working fluid properties on evaporative heat transfer at the microscale is examined.…”
mentioning
confidence: 99%
“…Moosman and Hoomsy [11] used a perturbation method to describe the thin-film profile change relative to the static isothermal profile. Hallinan et al [12] and Chebaro and Hallinan [13] solved the thin-film equations with a shooting technique and obtained the thickness profile under isothermal and nonisothermal interface conditions. Khrustalev and Faghri [14] demonstrated the importance of surface roughness in predicting the heat transfer coefficient in the grooved evaporator.…”
mentioning
confidence: 99%