Boundary Scan Extension for Testing Distributed Reconfigurable Hardware Systems

Ahmed, Asma Ben; Mosbahi, Olfa; Khalgui, Mohamed; Li, Zhiwu

doi:10.1109/tcsi.2019.2894441

Cited by 1 publication

(2 citation statements)

References 23 publications

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“…The values of matrix elements p ij and p ji are equal, indicating the probability of a short-circuit fault occurring between the network numbered i and the network numbered j, and their values are calculated according to Equation (2).…”

Section: Constructing the Probability Model Of Typical Faultsmentioning

confidence: 99%

“…The boundary scan test is an advanced technique for digital circuit fault detection, which is widely used in large-scale digital circuit tests due to its fast and efficient testing advantages [1][2][3][4][5]. However, with the increase in IC density and complexity, the scale of boundary scan test vectors also increases rapidly, which leads to a decrease in test efficiency and fault detection precision [6,7].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

A Boundary Scan Test Vectors Optimization Method Based on Improved GA-AO* Approach Considering Fault Probability Model

Su,

Guo,

Luo

et al. 2024

Applied Sciences

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The generation of test vectors is a key technique that affects the efficiency and fault detection rate of the boundary scan test. Aiming at the local optimal solution problem of the current common test vectors generation algorithm, this paper proposes a test vectors generation algorithm based on improved GA-AO* model, through which the test vectors are generated by using the idea of heuristic search and backtracking correction. In order to speed up the heuristic search, this paper designed a heuristic function with both prior and posterior parameters to describe the influence of typical faults on the failure probability index of the test vectors. At the same time, this paper used a genetic algorithm (GA) to determine the specific values of the posterior parameters iteratively. Finally, through theoretical analysis and physical verification, compared with the test vector generated by the traditional method, the test vector generated by this method is optimized on the prior failure probability index and performs better in the physical experiment.

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Section: Constructing the Probability Model Of Typical Faultsmentioning

confidence: 99%