Breaking correlation to improve testability

Ockunzzi, Kelly A.; Papachristou, C.

doi:10.1109/vts.2001.923421

Cited by 1 publication

(2 citation statements)

References 14 publications

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“…Correlation affects both controllability and observability, and can be measured with the correlation metric [10]. Correlation at the inputs to an operation restricts the test patterns that can be applied to that operation [2].…”

Section: Reconvergent Fanoutmentioning

confidence: 99%

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Test strategies for BIST at the algorithmic and register-transfer levels

Ockunzzi¹,

Papachristou²

2001

Proceedings of the 38th Conference on Design Automation - DAC '01

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The proposed BIST-based DFT method targets testability problems caused by three constructs. The first construct is reconvergent fanout in a circuit behavior, which causes correlation. The second construct, control statements, also cause correlation, and relational operations degrade observability. The third construct is random-pattern-resistant RTL modules, which cannot be tested effectively with random patterns. Test strategies are presented that overcome the testability problems by modifying the circuit behavior. An analysis and insertion scheme that systematically identifies the problems and applies the strategies is described. Experimental results from seven examples show that this scheme improves fault coverage while minimizing the impact on area and critical delay.

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Section: Reconvergent Fanoutmentioning

confidence: 99%

“…We focus on three constructs that cause testability problems, combining ideas from [10,11]. The first construct is reconvergent fanout in the circuit behavior, which causes correlation.…”

Section: Introductionmentioning

confidence: 99%

Test strategies for BIST at the algorithmic and register-transfer levels

Ockunzzi¹,

Papachristou²

2001

Proceedings of the 38th Conference on Design Automation - DAC '01

View full text Add to dashboard Cite

show abstract

Breaking correlation to improve testability

Cited by 1 publication

References 14 publications

Test strategies for BIST at the algorithmic and register-transfer levels

Test strategies for BIST at the algorithmic and register-transfer levels

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