Breaking the Fundamental Limitations of Nanoscale Ferroelectric Characterization: Non‐Contact Heterodyne Electrostrain Force Microscopy

During the past decade, Scanning Probe Microscopy (SPM) based surface strain detection techniques have been extensively used in the characterization of functional materials, structures, and devices. Here, we refer these techniques as Surface Strain Force Microscopy (SSFM), which mainly includes the Piezoresponse Force Microscopy, Atomic Force Acoustic Microscopy, Atomic Force Microscopy-Infrared spectroscopy (or photothermal induced resonance), Piezomagnetic Force Microscopy, and Scanning Joule Expansion Microscopy. The inception of SSFM opens up a pathway to study the nanoscale physical properties by using a sharp tip to detect the local field-induced surface strain. Through measuring the signals of the surface strain, multiple physical properties, such as the electromechanical, mechanical, photothermal, magnetic, thermoelastic properties, can be characterized with an unprecedented spatial resolution. In order to further develop and overcome the fundamental issues and limitations of the SSFM, the multi-frequency SPM technology has been introduced to the SSFM-based techniques, leading to the emerging of multi-frequency SSFM (MF-SSFM). As a technical breakthrough of the SSFM, MF-SSFM has demonstrated substantial improvements in both performance and capability, resulting in increased attentions and numerous developments in recent years. This Perspective is, therefore, aimed at providing a preliminary summary and systematic understanding for the emerging MF-SSFM technology. We will first introduce the basic principles of conventional SSFM and multi-frequency SPM techniques, followed by a detailed discussion about the existing MF-SSFM techniques. MF-SSFM will play an increasingly important role in future nanoscale characterization of the physical properties. As a result, many more advanced and complex MF-SSFM systems are expected in the coming years.

show abstract

Emerging multi-frequency surface strain force microscopy

Zeng

Sim

Yong

et al. 2023

Journal of Applied Physics

View full text Add to dashboard Cite

show abstract

Nano-scale ferroelectric domain differentiation in periodically poled lithium niobate with auger electron spectroscopy

2022

View full text Add to dashboard Cite

A new method for characterizing lithium niobate +/-Z ferroelectric polarization domains using Auger electron spectroscopy (AES) is presented. The domains of periodically poled samples are found to be differentiable using the peak amplitude of the Auger oxygen KLL transition, with -Z domains having a larger peak-amplitude as compared to +Z domains. The peak amplitude separation between domains is found to be dependent on the primary beam current, necessitating a balance between the insulating samples charging under the primary beam and achieving sufficient signal to noise in amplitude separation. AES amplitude-based domain characterization is demonstrated for fields of view (FOV) ranging from 1 μ m to 78 μ m. Domain spatial resolution of 91 nm is demonstrated at 1 μ m FOV.

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Breaking the Fundamental Limitations of Nanoscale Ferroelectric Characterization: Non‐Contact Heterodyne Electrostrain Force Microscopy

Abstract: (2 of 15)www.advancedsciencenews.com www.small-methods.com Results and Discussion Non-Contact Detection of ElectrostrainTo overcome the issues of contact-mode operation, a natural yet effective solution is to operate the PFM with a non-contact

Cited by 2 publications

References 121 publications

Emerging multi-frequency surface strain force microscopy

Emerging multi-frequency surface strain force microscopy

Nano-scale ferroelectric domain differentiation in periodically poled lithium niobate with auger electron spectroscopy

Contact Info

Product

Resources

About