Absorption and photoluminescence (PL) properties of silicon (Si) nanocrystals (NCs) covered with silicon dioxide (
SiO
2
) are fairly well unraveled; corresponding information for silicon nitride (
Si
3
normalN
4
) coverage is scarce. We elucidate important optical and electronic features depending on the embedding dielectric and interface defect (dangling bond, DB) properties. Using density functional theory (DFT) and time‐dependent (TD‐) DFT for ground state (GS) and excited state (ES) properties, respectively, we compute fully
NH
2
‐ and OH‐covered NCs of 11–26 Å size, enabling comparisons with experimental data. Our non‐radiative Shockley‐Read‐Hall (SRH) recombination model of DBs at NC/dielectric interfaces demonstrates that SRH recombination is substantially higher for
Si
3
normalN
4
‐covered NCs. An ensemble TD‐DFT calculation of the eight lowest fundamental transitions accurately describes the absorption edge. Exciton binding energies are significantly smaller in
SiO
2
‐ versus
Si
3
normalN
4
‐covered NCs due to the delocalizing versus self‐localizing impact of the dielectric onto the exciton. We find higher optical absorption rates for
Si
3
normalN
4
‐embedded NCs versus
SiO
2
‐embedded NCs. However, SRH interface recombination renders the PL of
Si
3
normalN
4
‐embedded NCs inferior to their
SiO
2
‐embedded counterparts. Finally, we explain a discrepancy in PL gaps of free‐standing oxidized versus
SiO
2
‐embedded NCs by considering adequate phononic boundary conditions.