1994
DOI: 10.1002/crat.2170290206
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Bridgman and Czochralski growth of GeSi alloy crystals

Abstract: Ge, -,Six crystals were grown with the Bridgman and the Czochralski method over a wide concentration range. With the Bridgman process single crystals up to 40 at.% Si were possible. The reasons for polycrystalline growth were the permanent contact of the interface with the crucible wall in combination with curvature towards the crystal and inclusions of high Si concentration. Analysis of striations in Czochralski grown material showed that in this process the crystal does not continuously grow in one direction… Show more

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Cited by 49 publications
(22 citation statements)
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“…The results derived from the FZ solidification experiments support the findings of diffusion controlled segregation profiles during directional solidification [38][39][40]. In spite of the rather slow processing speed, it seems that the mixing of the melt is not complete.…”
Section: Gravity Effectssupporting
confidence: 76%
See 1 more Smart Citation
“…The results derived from the FZ solidification experiments support the findings of diffusion controlled segregation profiles during directional solidification [38][39][40]. In spite of the rather slow processing speed, it seems that the mixing of the melt is not complete.…”
Section: Gravity Effectssupporting
confidence: 76%
“…In CZ-growth, solidified crystals do not have any contact to the container and the unavoidable cracking during the cooling phase does not pose any difficulty. This makes quartz the material of choice for Si-Ge CZ growthl Also for zone melting/leveling [9,25] of all Si-Ge compositions or Bridgman growth of Ge-rich material [38,40], the use of quartz boats and ampoules, respectively, is reported. By using extremely slow cooling rates, cracking of containers or ingots could be mostly avoided -however, a reaction between crystal and ampoule was still detected and identified as a source for polycrystalline growth.…”
Section: Crucible Materialsmentioning
confidence: 99%
“…Furthermore, we noticed apparent striations in the germanium concentration for Si 0.95 Ge 0.05 samples, with a periodicity around 15 μm. Such fluctuations are common in the growth of SiGe from both Czochralski and Bridgman processes (31)(32)(33). Generally these striations show a 10-to 15-μm periodicity independent of growth conditions, and commonly attributed to fluctuations in growth velocity associated with time-dependent temperature fluctuations at the interface that can be due to convection or fluctuations in solid-phase conductivity (31-33).…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, the availability of high quality and relatively defect free and compositionally uniform Si x Ge 1-x substrates is desirable, and will allow the deposition of thicker lattice matched alloys with high compositions. In order to achieve high quality Si x Ge 1-x crystals with different germanium contents, a variety of melt crystal growth techniques, such as Czochralski (Cz) [20][21][22][23], floating zone (FZ) [24], Bridgman [25,26], multi component [9], and liquid encapsulated zone melting [27], have been utilized. It is however difficult to grow single crystals by Cz [20,21], Bridgman [25,26] or FZ [24].…”
Section: Introductionmentioning
confidence: 99%