Bright and ultrafast electron point source made of LaB₆ nanotip

Abstract

The development of time-resolved transmission electron microscopy (TEM), ultrafast electron spectroscopy and pulsed X-ray sources relies on the realization of stable and high brightness sources of ultra-short electron bunches with...

Isotopic Correction of Compositional Inaccuracies in the Atom Probe Analysis of LaB6

“…A single crystal LaB 6 rod of 0.7 mm diameter and 10 mm length was electrochemically etched in a 10% HNO3 solution. More details about the sample fabrication were reported in references . A scanning electron microscope/focused ion beam (SEM/FIB) HELIOS 5 dual beam Xe plasma system was used to further sharpen the tip to an apex diameter of around 100 nm.…”

“…More details about the sample fabrication were reported in references. 35 A scanning electron microscope/focused ion beam (SEM/FIB) HELIOS 5 dual beam Xe plasma system was used to further sharpen the tip to an apex diameter of around 100 nm. In order to form a tip with a ∼50 nm radius of curvature, annular milling was first performed using a 30 kV ion beam, progressively reducing the beam current from 2 μA to 10 pA. A cleaning procedure using a 12 kV ion beam is performed to remove the surface damage arising from the high-energy Xe ions.…”