1990
DOI: 10.1109/22.54930
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Broad-band microwave measurements with transient radiation from optoelectronically pulsed antennas

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Cited by 76 publications
(7 citation statements)
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“…For the case where the sample thickness d s is greater than the reference thickness d r , 341 n s (u) = 4>(")-…”
Section: S R N 2 {Hi + H S )(H S + N 3 )mentioning
confidence: 99%
“…For the case where the sample thickness d s is greater than the reference thickness d r , 341 n s (u) = 4>(")-…”
Section: S R N 2 {Hi + H S )(H S + N 3 )mentioning
confidence: 99%
“…This technique is capable of free-space microwave measurements over a broad frequency range (15-135 GHz) with good (60 : 1) polarization sensitivity [7,8] . In addition, the phase sensitivity of COMITS allows direct determination of the dispersion relation for EM-wave propagation in photonic crystals [3] .…”
Section: Investigation Of Absolute Photonicmentioning
confidence: 99%
“…Signal averaging is performed by adding 1000 scans with a rapidscan delay line. A more detailed description of the COMITS technique is given in [8] .…”
Section: Investigation Of Absolute Photonicmentioning
confidence: 99%
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“…Recent experiments have shown that commuting devices of optoelectronic pulses associated with appropriate antennas can be used to generate, control and detect picosecond bursts of electromagnetic radiation. It leads to various applications (1) such as the transient radiation properties of antennas (2), the scattering of radiation by three-dimensional objects (3) or the characterization of material by the coherent microwave transient spectroscopy technique (4).…”
Section: Introductionmentioning
confidence: 99%