1997
DOI: 10.1063/1.365296
|View full text |Cite
|
Sign up to set email alerts
|

Broad photoluminescence band in undoped AlxGa1−xAs grown by organometallic vapor phase epitaxy

Abstract: We have studied the 77 K photoluminescence ͑PL͒ of undoped-Al x Ga 1Ϫx As (0.21рxр0.83) grown by organometallic vapor phase epitaxy. A deep broad ͑DB͒ PL band is found at 1.6-1.7 eV at a range of x from 0.21 to 0.63, with a maximum intensity at around xϭ0.5. Its large full width at half-maximum (ϳ200 meV) suggests that this emission originates from some impurity-defect complex. The Si-and C-doping dependencies of the PL reveal that the emission disappears in Si-doped n-type samples while it increases in intens… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

1998
1998
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 25 publications
0
2
0
Order By: Relevance
“…To investigate light‐dependent recombination, the integrated PL intensity under various excitation powers was measured. The integrated PL intensity is directly related to the excitation power through a power index, represented by the formula IPF, where I is integrated PL intensity, P is excitation power, and F is the parameter reflected in the various recombination processes 47 . An F value of 1 indicates that radiative recombination dominates.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…To investigate light‐dependent recombination, the integrated PL intensity under various excitation powers was measured. The integrated PL intensity is directly related to the excitation power through a power index, represented by the formula IPF, where I is integrated PL intensity, P is excitation power, and F is the parameter reflected in the various recombination processes 47 . An F value of 1 indicates that radiative recombination dominates.…”
Section: Resultsmentioning
confidence: 99%
“…The integrated PL intensity is directly related to the excitation power through a power index, represented by the formula I / P F , where I is integrated PL intensity, P is excitation power, and F is the parameter reflected in the various recombination processes. 47 An F value of 1 indicates that radiative recombination dominates. Otherwise, if F >1, the SRH recombination dominates owing to the presence of nonradiative recombination center, which act as defects.…”
Section: Analysis Of Leakage Current and Charge Recombinationmentioning
confidence: 99%