Broad spectrum element-specific X-ray imaging

Austin, J. Christopher; Pitt, Kate; Haycock, P.W.; Heywood, Brigid R.; George, Soney C.; Liddle, J. Alexander

doi:10.1016/j.ndteint.2003.09.012

Cited by 7 publications

(2 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Considerable progress has been made in this direction already (7)(8)(9)(10)(11)(12)(13)(14)(15) . The applications considered relate to forensics, security and authentication of antiquities and artworks.…”

Section: Introductionmentioning

confidence: 99%

Requirements for commercial X-ray element-specifc imaging technology

Austin¹

2011

Insight - Non-Destructive Testing and Condition Monitoring

View full text Add to dashboard Cite

Analysis of the composition of material samples nondestructively by means of standard X-ray tube imaging is extremely challenging due to the breadth of the bremsstrahlung spectrum, resulting from mono-energetic electrons striking a thick tungsten target. In previous work, stacks of registered field-flattened images of various samples over an energy range 15-150 keV were created and analysed. Attempts to remove the effects of the broad spectrum proved the concept of element-specific imaging, but problems still remained. In this work, modification strategies to existing designs are proposed in both hardware and software, which would bolster efforts to remove the effects of the broad X-ray spectrum.

show abstract

Section: Introductionmentioning

confidence: 99%

Requirements for commercial X-ray element-specifc imaging technology

Austin¹

2011

Insight - Non-Destructive Testing and Condition Monitoring

View full text Add to dashboard Cite

show abstract

“…However, there is significant potential for a simpler form of element-specific mapping that can probe more deeply such as in industrial process control, security systems [10], forensic science and the analysis of ancient artefacts. In an earlier paper [11], we showed that it was possible to generate elementspecific and element-exempt images for silver and barium, and therefore any elements in between these, using standard laboratory X-ray sources.…”

Section: Introductionmentioning

confidence: 99%

Element-specific determination of X-ray transmission signatures using neural networks

Day¹,

Austin²,

Butcher³

et al. 2009

NDT & E International

View full text Add to dashboard Cite

Single element mapping in radiography

et al. 2009

View full text Add to dashboard Cite

This article reports on the application of element‐specific mapping using the Bremsstrahlung of a commercial broad spectrum X‐ray source to map lighter elements (zirconium to tin) and heavier elements (tantalum to bismuth) individually within an image field. Grey level or image brightness has been obtained as a function of acceleration potential over a range of 15–75 kV for lighter elements and 55–150 kV for heavier elements at 1 kV intervals. Tikhonov regularisation was applied to the experimental grey level functions, using a model of the spectrum, to enhance spectral features associated with elemental K‐edges. These features were then used to test for a specific element at all points within an X‐ray image in order to map its presence over the whole image field. Hence it has been shown that it is possible to map specific target elements within an image, provided the grey level function over an appropriate energy range is known at all points. Copyright © 2009 John Wiley & Sons, Ltd.

show abstract

Broad spectrum element-specific X-ray imaging

Cited by 7 publications

References 16 publications

Requirements for commercial X-ray element-specifc imaging technology

Requirements for commercial X-ray element-specifc imaging technology

Element-specific determination of X-ray transmission signatures using neural networks

Single element mapping in radiography

Contact Info

Product

Resources

About