Broadband Characterization of Copper Roughness by Comparing Striplines Fabricated on VLP and RTF Copper

Luevano, Gerardo Romo; Michalka, Tim; Sriboonlue, Varin

doi:10.1109/emcsi38923.2020.9191534

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Broadband Characterization of Copper Roughness by Comparing Striplines Fabricated on VLP and RTF Copper

Cited by 4 publications

References 7 publications

Thermally Induced Losses on High Speed Interconnects

Thermally Induced Losses on High Speed Interconnects

Determining the Permittivity of a PCB Dielectric Using Striplines Considering Copper Roughness

Relative Permittivity and Loss Tangent Determination Combining Broadband S-parameter and Single-Frequency Resonator Measurements

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