2011
DOI: 10.1038/pj.2010.145
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Broadening, no broadening and narrowing of glass transition of supported polystyrene ultrathin films emerging under ultraslow temperature variations

Abstract: We report X-ray reflectivity measurements of polystyrene thin films supported on Si substrates at various heating and cooling rates. At a heating rate of 0.05 1C min À1 , the width of the glass transition w does not show any noticeable thickness dependence. However, at faster (0.5 1C min À1 ) and slower (0.01 1C min À1 ) heating rates, w shows remarkable thickness dependence: it broadens at a faster rate and narrows at a slower rate with decreasing film thickness. Our results suggest that the heterogeneous cha… Show more

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Cited by 8 publications
(11 citation statements)
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“…The in-plane heterogeneous periodicity of surface undulation gives diffuse scattering normal to the q z direction in reciprocal space; therefore, the broad peak observed in the q z scan profiles might originate from the diffuse scattering component superimposed on the specular reflection along the q z direction. Another possibility of the emergence of the broad peak is the presence of a periodic layered structure normal to the PS surface; however, this is not probable because the periodic layered structure normal to the sample surface would exhibit a periodic interference fringe pattern in the XR profiles, as reported in previous studies [1,4,7,20,23,24]. We observed only one peak at q z = 0.04Å −1 in the XR profiles.…”
Section: Resultssupporting
confidence: 62%
“…The in-plane heterogeneous periodicity of surface undulation gives diffuse scattering normal to the q z direction in reciprocal space; therefore, the broad peak observed in the q z scan profiles might originate from the diffuse scattering component superimposed on the specular reflection along the q z direction. Another possibility of the emergence of the broad peak is the presence of a periodic layered structure normal to the PS surface; however, this is not probable because the periodic layered structure normal to the sample surface would exhibit a periodic interference fringe pattern in the XR profiles, as reported in previous studies [1,4,7,20,23,24]. We observed only one peak at q z = 0.04Å −1 in the XR profiles.…”
Section: Resultssupporting
confidence: 62%
“…This result is again consistent with the a glass value reported for 70-nm-thick films of molecular weight 2.34 Â 10 5 g mol À1 measured at heating rates of 0.5 and 0.01 1C min À1 . 32 However, in the case of the thinner films (B12 and 6 nm), the a glass value was found to increase with decreases in the heating rate. Figure 2 illustrates the temperature dependence of the T g of PS films obtained at various heating rates.…”
Section: Methodsmentioning
confidence: 93%
“…The details of the analysis have been previously described. 32,33 RESULTS Figure 1 illustrates the temperature dependence of the normalized thicknesses that were obtained at heating rates of 0.14 1C Figure 1 are the fitted curves obtained by assuming the 'tanh' profile approximation: 4…”
Section: Methodsmentioning
confidence: 99%
“…This temperature-dependent thickness behavior is probably attributable to the glass transition upon cooling. The glassy-to-viscous state transition of T g is typically determined as the intersection of the two straight lines showing different linear expansivities [18]. In this way, we determined the T g of trehalose nano-film as 95°C.…”
Section: Temperature-dependent Behaviors Of Sugar Nano-filmsmentioning
confidence: 99%
“…The importance of these findings in the pharmaceutical field cannot be overstated. Specular X-ray reflectivity (XRR) is a unique and powerful analytical method (Figure 2) that is frequently applied to condensed soft-matter films, including glass transition studies of ultrathin polymer films [16][17][18][19][20], but which has not been applied in amorphous sugar studies. XRR can evaluate the layered structure of a material, such as the film thickness, electron density, surface roughness, and interfacial width [21,22].…”
Section: Introductionmentioning
confidence: 99%