2008
DOI: 10.1016/j.jallcom.2007.09.131
|View full text |Cite
|
Sign up to set email alerts
|

Brush plated ZnS films and their properties

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
3
1

Year Published

2010
2010
2024
2024

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 9 publications
(5 citation statements)
references
References 18 publications
1
3
1
Order By: Relevance
“…Therefore, the preparation conditions of a given technique greatly affect not only the number of phases formed but also its microstructural properties such as crystallinity. These results are in agreement with Muraliet al [14]. The crystallite size was measured using Debye Scherrer's formula [11].…”
Section: Fig 2 Xrd Patterns Of Boron Doped Non-annealed Zns Filmssupporting
confidence: 91%
“…Therefore, the preparation conditions of a given technique greatly affect not only the number of phases formed but also its microstructural properties such as crystallinity. These results are in agreement with Muraliet al [14]. The crystallite size was measured using Debye Scherrer's formula [11].…”
Section: Fig 2 Xrd Patterns Of Boron Doped Non-annealed Zns Filmssupporting
confidence: 91%
“…It can be inferred that the direct band gap value is about 5.3 eV through extension method. The obtained value is larger than relevant literature [24], this may be caused by quantum effect [25], and also by crystallization, grain size, and the stress and impurities on the films. Therefore, the films can be suitably employed in photosensor and optoelectronic applications.…”
Section: Uv Spectracontrasting
confidence: 70%
“…The dislocation density δ, defined as the length of dislocation lines per unit volume of the crystal has been evaluated using the formula [8] δ=1/D 2 ……………(2) It is observed that the dislocation density decreases with increase of grain size. Information on the particle size and strain for the AgGaSe 2 films was obtained from the full-width at half-maximum of the diffraction peaks.…”
Section: Resultsmentioning
confidence: 99%