2019
DOI: 10.1109/access.2019.2894976
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Bug Localization for Version Issues With Defect Patterns

Abstract: Version issues are becoming more and more prominent with the continuous development of software. Bug localization for version issues is time-consuming and labor-intensive. Although some bug localization techniques, such as those based on information retrieval (IR), have been proposed, they cannot handle these bugs very well as the version-related bugs have their own defect patterns. However, few existing works have focused on revealing these defect patterns and utilizing them for localization of bugs. To fill … Show more

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Cited by 20 publications
(5 citation statements)
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“…Software parameters and metrics are essential to measure and assess various aspects of software development to ensure its quality and effectiveness [11]. Metrics are indicators that describe specific attributes of the software Process Efficiency, Effort Assessment, Defect Reduction and Project Performance Evaluation [21,22].…”
Section: Software Defects Metricsmentioning
confidence: 99%
“…Software parameters and metrics are essential to measure and assess various aspects of software development to ensure its quality and effectiveness [11]. Metrics are indicators that describe specific attributes of the software Process Efficiency, Effort Assessment, Defect Reduction and Project Performance Evaluation [21,22].…”
Section: Software Defects Metricsmentioning
confidence: 99%
“…IR‐based bug localization. There are a lot of research studies applying information retrieval technology to bug localization [8–18, 36, 37, 39, 48, 53, 54]. Lukins et al.…”
Section: Related Workmentioning
confidence: 99%
“…Fine grained bug localization. In recent years, researchers have applied information retrieval technology to bug localization [8][9][10][11][12][13][14][15][16][17][18]. They use bug reports as queries, search for relevant code fragments, and rank the code fragments according to the similarity between the code fragments and the bug report.…”
Section: Introductionmentioning
confidence: 99%
“…A new strategy that utilizes edition-related defect characteristics to pinpoint variant defects combined with the data extraction technique has been proposed to fill this gap [2]. In [3], it has been proposed to use stacked denoising autoencoders, a well-known machine learning paradigm, to generate deep representations from standard software measurements.…”
Section: Introductionmentioning
confidence: 99%