Built-In Self Repair for Embedded NAND-Type Flash Memory

Abstract

BIST(Built-in self test) is to detect various faults of the existing memory and BIRA(Built-in redundancy analysis) is to repair detected faults by allotting spare. Also, BISR(Built-in self repair) which integrates BIST with BIRA, can enhance the whole memory's yield. However, the previous methods were suggested for RAM and are difficult to diagnose disturbance that is NAND-type flash memory's intrinsic fault when used for the NAND-type flash memory with different characteristics from RAM's memory structure. Therefore, this paper suggests a BISD(Built-in self diagnosis) to detect disturbance occurring in the NAND-type flash memory and to diagnose the location of fault, and BISR to repair faulty blocks.

Architecture for an efficient MBIST using modified March-y algorithms to achieve optimized communication delay and computational speed

“…The results of the investigation portray that, for a 4 G-digit streak retention tried through the March-FT test calculation by strong information foundations, their technique was fit for diminishing the test time to 48.628% of the ordinary assessment conspire. Kim and Chang (2014) have suggested an organized approach for challenging flash memories, which entails the improvement of March-like test procedures, price effective error diagnosis approach and fitted self-test (BIST)system. The enhanced tests algorithms have the ability to identify the disturb faults, which are drawn from the IEEE STD 1005, as well as the conventional faults.…”