2020 IEEE 38th VLSI Test Symposium (VTS) 2020
DOI: 10.1109/vts48691.2020.9107627
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Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits

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“…[62] avoids utilizing clock trees and sync-async interfacing circuitries, which significantly reduces the area overhead (on an average) as compared to other schemes. This work later acted as a motivation for the development of a BIST scheme for SCL circuits [63].…”
Section: Significantlymentioning
confidence: 99%
“…[62] avoids utilizing clock trees and sync-async interfacing circuitries, which significantly reduces the area overhead (on an average) as compared to other schemes. This work later acted as a motivation for the development of a BIST scheme for SCL circuits [63].…”
Section: Significantlymentioning
confidence: 99%