Built-in test for complex digital integrated circuits

Konemann, B.; Zwiehoff, G.; Muchα, J.

doi:10.1109/jssc.1980.1051391

Cited by 136 publications

(26 citation statements)

References 5 publications

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“…The BILBO is a class of BIST techniques [13]. The BILBO uses BILBO FFs, the construction of which is illustrated in Fig.…”

Section: Bilbomentioning

confidence: 99%

“…Finally, the FFs output logic zero.) Table 2 shows a comparison between the proposed FF and four conventional FFs, namely a normal FF, a BISER FF [4], a BILBO FF [13], and a combination of BISER and BILBO FFs, which we can obtain by using a BISER FF as F in the BILBO FF shown in Fig. 3 (a).…”

Section: Reconfigurable C-elementmentioning

confidence: 99%

“…This paper presents a construction of a built-in logic block observer (BILBO) architecture with soft-errortolerant capability. The BILBO is a class of BIST, and uses BILBO FFs [13]. The BILBO FFs can form linear feedback shift registers (LFSRs), which are used as built-in TPGs and/or ORAs.…”

Section: Introductionmentioning

confidence: 99%

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Construction of BILBO FF with Soft-Error-Tolerant Capability

Namba

Ito

2011

IEICE Trans. Inf. & Syst.

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SUMMARYIn this paper, a soft-error-tolerant BILBO (Built-In Logic Block Observer) FF (flip-flop) is presented. The proposed FF works as a soft-error-tolerant FF in system operations and as a BILBO FF in manufacturing testing. The construction of the proposed FF is based on that of an existing soft-error-tolerant FF, namely a BISER (Built-In Soft Error Resilience) FF. The proposed FF contains a reconfigurable C-element with XNOR calculation capability, which works as a C-element for soft-errortolerance during system operations and as an XNOR gate employed in linear feedback shift registers (LFSRs) during manufacturing testing. The evaluation results shown in this paper indicate that the area of the proposed FF is 8.5% smaller than that of a simple combination of the existing BISER and BILBO FFs. In addition, the sum of CLK-Q delay and D-CLK setup times on system operations for the proposed FF is 19.7% shorter than that for the combination. key words: soft-error-tolerance, DFT (design for test), BISER (built-in soft-error resilience), BILBO (built-in logic block observer), reconfigurable C-element

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“…The BILBO is a class of BIST techniques [13]. The BILBO uses BILBO FFs, the construction of which is illustrated in Fig.…”

Section: Bilbomentioning

confidence: 99%

Section: Reconfigurable C-elementmentioning

confidence: 99%

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Construction of BILBO FF with Soft-Error-Tolerant Capability

Namba

Ito

2011

IEICE Trans. Inf. & Syst.

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“…The same problem occurs when the signature in R\ is to be scanned out. The total number of clock cycles spent in initializing BILBO registers in a test session is given by (1) where Ri is the highest indexed register during the test session. Similarly, the total number of clock cycles required to scan out the signatures during a test session is given by T,i gout = Y^-L nt where RL is the least indexed MISR during the test session.…”

Section: Long Scan-in and Scan-out Timesmentioning

confidence: 99%

“…Built-in Logic Block Observation (BILBO) introduced in [1] is a popular technique to achieve Builtin Test capability in modern-day VLSI systems. The BILBO-BIST methodology relies on pseudo-random testing of functional modules.…”

Section: Introductionmentioning

confidence: 99%

A novel BIST architecture with built-in self check

Abdulla

Ravikumar²,

Kumar³

Proceedings of 9th International Conference on VLSI Design

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Automatic Testing

Belfore

1999

Wiley Encyclopedia of Electrical and Electronics Engineering

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The sections in this article are Testing Principles Design for Testability Test Pattern Generation CAD Tools Mixed‐Signal Testing Automatic Test Examples Emerging Technologies Summary Appendix 1. Acronyms and Abbreviations

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Built-in test for complex digital integrated circuits

Cited by 136 publications

References 5 publications

Construction of BILBO FF with Soft-Error-Tolerant Capability

Construction of BILBO FF with Soft-Error-Tolerant Capability

A novel BIST architecture with built-in self check

Automatic Testing

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