“…Residual stress can be introduced in thin films including polymer thin films through volume changes, which may take place in association with crosslinking or crystallization mainly due to: 1. Interferometers: (Huang, Lou, Tsai, Wu, & Lin, 2007;Huston, Sauter, Bunt, & Esser, 2001;Maier-Schneider, Maibach, & Obermeier, 1995;Tsakalakos, 1981;Wu, Fang, & Yip, 2004;Xiang & Chen, 2005;Zheng et al, 2000) 2. Atomic force Microscope (AFM): (Schweitzer & Göken, 2007) 3.…”