Bulk-to-surface segregation measurements of Cu and S in a Ni-Cu(S) ternary system with Auger electron spectroscopy

Yan, X.L.; Lv, Q.S.; Wang, J.Y.; Swart, H.C.; Terblans, J.J.; Lian, S.Y.; Liu, J.

doi:10.1016/j.apsusc.2024.161949

Applied Surface Science

2025

DOI: 10.1016/j.apsusc.2024.161949

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Bulk-to-surface segregation measurements of Cu and S in a Ni-Cu(S) ternary system with Auger electron spectroscopy

X.L. Yan,

Q.S. Lv,

J.Y. Wang

et al.

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Bulk-to-surface segregation measurements of Cu and S in a Ni-Cu(S) ternary system with Auger electron spectroscopy

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References 25 publications

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