Button shear testing for adhesion measurements of 2D materials
Josef Schätz,
Navin Nayi,
Jonas Weber
et al.
Abstract:Two-dimensional (2D) materials are considered for numerous applications in microelectronics, although several challenges remain when integrating them into functional devices. Weak adhesion is one of them, caused by their chemical inertness. Quantifying the adhesion of 2D materials on three-dimensional surfaces is, therefore, an essential step toward reliable 2D device integration. To this end, button shear testing is proposed and demonstrated as a method for evaluating the adhesion of 2D materials with the exa… Show more
“…Two-dimensional (2D) materials, such as graphene, are being considered for numerous applications in microelectronics [16,17] and other fields, but their integration into functional devices is challenging [16,18]. In view of the above, several challenges arise.…”
Section: Discussionmentioning
confidence: 99%
“…In view of the above, several challenges arise. One of the challenges is the poor adhesion of 2D materials due to their chemical inertness [16,19]. I see opportunities here related to plasma and/or laser beam processing.…”
Materials science, especially in the context of nanotechnology, plays a key role in today’s world, contributing to the development of advanced materials with unique properties [...]
“…Two-dimensional (2D) materials, such as graphene, are being considered for numerous applications in microelectronics [16,17] and other fields, but their integration into functional devices is challenging [16,18]. In view of the above, several challenges arise.…”
Section: Discussionmentioning
confidence: 99%
“…In view of the above, several challenges arise. One of the challenges is the poor adhesion of 2D materials due to their chemical inertness [16,19]. I see opportunities here related to plasma and/or laser beam processing.…”
Materials science, especially in the context of nanotechnology, plays a key role in today’s world, contributing to the development of advanced materials with unique properties [...]
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