2008
DOI: 10.2528/pier08042504
|View full text |Cite
|
Sign up to set email alerts
|

Calculating the Radar Cross Section of the Resistive Targets Using the Haar Wavelets

Abstract: Abstract-In this paper, the Haar wavelets basis functions are applied to the method of moments to calculate the radar cross section of the resistive targets. This problem is modeled by the integral equations of the second kind. An effective numerical method for solving these integral equations is proposed. The problem is treated in detail, and illustrative computations are given for several cases. This method can be generalized to apply to objects of arbitrary geometry.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
8
0

Year Published

2008
2008
2018
2018

Publication Types

Select...
10

Relationship

2
8

Authors

Journals

citations
Cited by 15 publications
(8 citation statements)
references
References 59 publications
0
8
0
Order By: Relevance
“…Through the known relationships between P F A and P D , which include signal-to-noise ratio and detector threshold for all the Swerling fluctuation types, FTIP is also related to the P D , hence it is possible to form a relationship between signal and data processing units. Also, the results can be easily extended to any other given expanded-Swerling or Non-Swerling fluctuation probability distribution [29][30][31][32]. Continuing with the TI process, any measurement extracted at the 3rd sampling time must comply with the constraints (and their derived forms) given in Appendix A.…”
Section: Ftip Analysis For the Rule-based Ti Scheme With Position Onlmentioning
confidence: 99%
“…Through the known relationships between P F A and P D , which include signal-to-noise ratio and detector threshold for all the Swerling fluctuation types, FTIP is also related to the P D , hence it is possible to form a relationship between signal and data processing units. Also, the results can be easily extended to any other given expanded-Swerling or Non-Swerling fluctuation probability distribution [29][30][31][32]. Continuing with the TI process, any measurement extracted at the 3rd sampling time must comply with the constraints (and their derived forms) given in Appendix A.…”
Section: Ftip Analysis For the Rule-based Ti Scheme With Position Onlmentioning
confidence: 99%
“…Integral equation technique is a well-known approach for modeling of Electromagnetics problems and many of such problems are modeled by Fredholm integral equations of the first kind [1][2][3][4][5][6]. These equations are in general ill-posed.…”
Section: Introductionmentioning
confidence: 99%
“…The first harmonic frequency can be obtained from a simple and traditional spectral analysis. For the mother wavelet function, a discrete Meyer wavelet function was adopted because it is known to be appropriate for harmonic analysis [19,20]. With the WD prior to the EMD, there can be less possibility that each extracted IMF has multiple frequency components because the WD limits the frequency band larger than the first harmonic frequency.…”
Section: Modified Hhtmentioning
confidence: 99%