Calibrated measurement of optoelectronic frequency response

Abstract

We describe the most straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.

Subtraction of scattering parameters for small-signal modulation characteristics of laser diode

“…As shown in Fig. 1b, the scattering matrix of the intrinsic laser can be expressed in terms of the light power at the output port, the incident-wave a and reflected-wave b at the input port [5].…”

“…where Z r is usually set to be 50 Ω [5,6]. Therefore, the transfer function of the intrinsic laser can be expressed as…”

Characterization of Microwave Photonic Components

“…It has also been shown that one way of overcoming perturbation sensitivity (or 'interferometric noise') is to insert a sufficiently long length of fibre between the source of the reflections so that the multiple reflections are uncorrelated and do not add coherently [36]. However, it is still necessary to locate the position of the reflections (and their reflection coefficients) to have a completely characterized system [37].…”

“…(iv) Optical Cavity Effects Hale and Williams [37] point out that if both the optical source and photoreceiver in the transmission test set (Figure 10.13) have non-zero optical reflection coefficients, a Fabry-Perot resonator will be formed if an optical fibre is inserted between them. This situation is analogous to that considered in Figure 10.9.…”

“…In the discussion that follows, we will assume that a photoreceiver transfer standard is available, and that its responsivity RðjvÞis known in a 50 W system. The heterodyne techniques that are used to determine the responsivity of the transfer standard are described in [37] and are outlined in Appendix 10.B.…”