2022
DOI: 10.1021/acsami.2c14507
|View full text |Cite
|
Sign up to set email alerts
|

Calibrating the Hole Mobility Measurements Implemented by Transient Electroluminescence Technology

Abstract: To date, measuring the carrier mobility in semiconductor films, especially for the amorphous organic small-molecule films, is still a big challenge. Here, we demonstrate that transient electroluminescence (TrEL) spectroscopy with quantum-dot light-emitting diodes as the platform is a feasible and reliable method to evaluate the carrier mobility of such amorphous films. The position of the exciton formation zone is precisely determined and controlled by employing a quantum dot monolayer as the emissive layer. T… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
3
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 12 publications
(3 citation statements)
references
References 51 publications
0
3
0
Order By: Relevance
“…The QLEDs with an inverted device structure, as shown in Figure a, are fabricated. The schematic diagram shown in Figure S1 exhibits the energy level structure of each functional layer and the carrier dynamics processes. The synthesis of ZnO NPs and the fabrication procedures of the devices are described in detail in our previous reports. A WO x film fabricated under humidity of 24% is inserted between ITO and ZnO as the HSL, with the thicknesses of ∼3, 7, 12, and 17 nm. The WO x films were fabricated by spin-coating the precursor solution (5, 10, 15, and 20 mg/mL) at 3000 rpm for 60 s in atmosphere, followed by thermal annealing at 150 °C.…”
mentioning
confidence: 99%
“…The QLEDs with an inverted device structure, as shown in Figure a, are fabricated. The schematic diagram shown in Figure S1 exhibits the energy level structure of each functional layer and the carrier dynamics processes. The synthesis of ZnO NPs and the fabrication procedures of the devices are described in detail in our previous reports. A WO x film fabricated under humidity of 24% is inserted between ITO and ZnO as the HSL, with the thicknesses of ∼3, 7, 12, and 17 nm. The WO x films were fabricated by spin-coating the precursor solution (5, 10, 15, and 20 mg/mL) at 3000 rpm for 60 s in atmosphere, followed by thermal annealing at 150 °C.…”
mentioning
confidence: 99%
“…Based on the transient resolved electroluminescence analysis of QLED devices, , the operation of blue QLED devices can be simulated using a single-RC equivalent circuit model. The effectiveness of a single-RC equivalent circuit is also supported by the single semicircle feature in Nyquist plots (Figure S4a).…”
mentioning
confidence: 99%
“…Before fabrication, the ITO substrates were ultrasonically cleaned in acetone, ethanol, and deionized water in sequence for 15 min each and then dried by nitrogen flow. The detailed procedures for the device fabrication can be found in our previous reports. The CdSe/ZnS QDs were purchased from Najing Technology Corp ., and other materials were purchased from Xi’an Polymer Light Technology Corp . The CdSe/ZnS QDs were purchased from Najing Technology Corp.…”
mentioning
confidence: 99%