2003
DOI: 10.1016/s0030-4018(02)02290-3
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Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement

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Cited by 141 publications
(71 citation statements)
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“…The LUT contains the related coefficients that appear in the phase-to-height relationship for each pixel. In this method, the height for each pixel is obtained as a fractional equation or a polynomial equation of the phase value [11][12][13][14]:…”
Section: Phase-to-height Relationship By Lutmentioning
confidence: 99%
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“…The LUT contains the related coefficients that appear in the phase-to-height relationship for each pixel. In this method, the height for each pixel is obtained as a fractional equation or a polynomial equation of the phase value [11][12][13][14]:…”
Section: Phase-to-height Relationship By Lutmentioning
confidence: 99%
“…A typical 3-D measurement system based on a fringe pattern projection (FPP) system [2][3][4][5][6][7][8][9][10][11][12][13][14] is constructed using a white light projector and a charge-coupled device (CCD) camera. The projector projects sinusoidal fringe patterns onto an object, and the CCD camera acquires the patterns that are deformed by the object's shape.…”
Section: Introductionmentioning
confidence: 99%
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“…Empirical calibration methods are generally performed by capturing a series of fringe patterns for a flat surface that is placed at different known depths (d 0 , d 1 ,…,d n ), and then a direct phaseto-depth relationship is established, usually using polynomial fitting [10], or interpolation [11].…”
Section: Introductionmentioning
confidence: 99%