Calibration of electric coaxial near-field probes and applications

Gao, Yingjie; Lauer, Andreas K.; Ren, Qiming; Wolff, I.

doi:10.1109/22.734563

Cited by 52 publications

(28 citation statements)

References 16 publications

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“…The E-field uniformity was measured in an area of 0.5 m × 0.5 m using (2), located in the turntable zone ( Figure 4) at a height of 1.3 m. This area corresponds to the minimum size suitable for an EM probe (HI-6053). The E-field uniformity was measured in the four corners of the mesh comparing the higher with the lower E-field strength measurements results, using (9). Figure 2 shows the major variation of E-field uniformity between 80-1000 MHz.…”

Section: Requirements and Conditionsmentioning

confidence: 99%

“…In order to validate this method, it is necessary to meet the requirements established in IEEE 1309 [3] and other investigations [4][5][6][7][8][9][10][11].…”

Section: Requirements and Conditionsmentioning

confidence: 99%

“…In this paper, an EM probe calibration method is proposed, in the frequency range from 80 MHz to 1 GHz inside a 3-meter SAC, taking into consideration of the recommendations of IEEE 1309 [3] and other publications [4][5][6][7][8][9][10][11]. The E-field strengths were calibrated at 2, 4, 9 and 20 V/m, and the reference probes used were the Multi Axis Monopole Probe (ETS-Lindgren HI-6105) and the Orthogonal Dipole Probe (ETS-Lindgren HI-6053).…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

An Interpolation Method to Calibrate Electromagnetic Probes in Semi-Anechoic Chambers

Tremola¹,

Azpúrua²,

Páez³

et al. 2012

PIER B

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Abstract-Based upon the standard IEEE 1309, a new calibration method for electromagnetic (EM) probes is proposed. The aforementioned method compares the electric field strength measured with the EM probe subject to calibration with the E-field intensity calculated through a linear interpolation of the corrected measurement using a reference EM probe. The corrected measurement results are computed by means of the calibration factors stated in the calibration certificate of the reference EM probe. The conditions and criteria, under which it is possible to calibrate EM probes inside semi-anechoic chambers in the frequency range of 80 MHz to 1 GHz, are presented. The results shows that the calibration method proposed in this paper is characterized by deviations less than 1 dB in almost all the frequencies considered, verifying the reliability of the method. The proposed approach is very useful for registering the measurement drift of EM probes used in EMC testing laboratories.

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Section: Requirements and Conditionsmentioning

confidence: 99%

“…In order to validate this method, it is necessary to meet the requirements established in IEEE 1309 [3] and other investigations [4][5][6][7][8][9][10][11].…”

Section: Requirements and Conditionsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

An Interpolation Method to Calibrate Electromagnetic Probes in Semi-Anechoic Chambers

Tremola¹,

Azpúrua²,

Páez³

et al. 2012

PIER B

View full text Add to dashboard Cite

show abstract

“…The size of these conductors decides the performance of the probe, as the voltage V induced in a dipole by the incident field E is given by the following expression [7]: where l is the length of the dipole and I the current flowing in the probe. However, the size is also linked to the probe's sensitivity, bringing us to a technical limit in the characterization of microelectronic components [7,19,20]. Fig.…”

Section: The Coaxial Probesmentioning

confidence: 99%

Improvement of Electrical Near-Field Measurements With an Electro-Optic Test Bench

David¹,

Baudry²,

Louis³

2012

PIER B

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Abstract-In this paper, two different kinds of near-field measurement techniques are presented. The first one uses coaxial probes that do not give precise measurements on microelectronic devices. We saw in [1] that the spatial resolution of these probes reaches 500 µm for monopole and is millimetric for dipole probe. The second one is based on the Pockels effect that converts an electromagnetic (EM) field into optical modulation. Our objective is to improve the E x /E y near-field measurement with this second technique. The performance of the electro-optic (EO) probe is compared with dipole probes of 2.5 and 5 mm with the use of simulations and measurements, on a wire above a ground plane and on coupled microstrip lines. At the end, a discussion about the technical limitations of the EO probe is made.

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“…By analyzing the electric and magnetic field distribution above the circuit surface [1] one can evaluate quantitatively the field sources or explain the signal coupling between the circuit components. For acquisition of microwave electric intensities in a near-field region short coaxial antennas [1,2] are commonly used. In such antennas a central conductor protrudes for a defined length from the shielding.…”

Section: Introductionmentioning

confidence: 99%

<title>High-resolution near-field measurements of microwave circuits</title>

Kantor

Shvets

2004

SPIE Proceedings

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In this paper we report on measurements of electric field intensities of microwave field above surface of microwave circuits using miniaturized coaxial antennas. During the scanning process the antenna is driven at various distances above the sample surface according to topographic data acquired prior to the field measurement. A position/signal difference method is used to increase the spatial resolution of the antenna to about 20 jm ( A/104) -one order of magnitude better than contemporary microwave scanning systems. For measurement of the tangential field components parallel to the sample surface the antenna is tilted by about 45° relative to the sample surface. By its rotation about the vertical axis various components of the field are measured, vertical and horizontal electric field intensities are recalculated. Performance of our scanning system utilizing these methods is tested using a PCB surface capacitor, a microstrip filter and a microstrip transmission line.

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Calibration of electric coaxial near-field probes and applications

Cited by 52 publications

References 16 publications

An Interpolation Method to Calibrate Electromagnetic Probes in Semi-Anechoic Chambers

An Interpolation Method to Calibrate Electromagnetic Probes in Semi-Anechoic Chambers

Improvement of Electrical Near-Field Measurements With an Electro-Optic Test Bench

<title>High-resolution near-field measurements of microwave circuits</title>

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