Calibration of microwave network analyser for computer-corrected
            <i>S</i>
            parameter measurements

Silva, E.F. da; McPhun, M.K.

doi:10.1049/el:19730093

Cited by 15 publications

(5 citation statements)

References 1 publication

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“…This procedure minimizes the effects of the drawbacks mentioned previously. A general calibration procedure for microwave measurements uses a short-circuit, an open circuit and a matched load for terminations [114][115][116][117][118]. The open-circuit condition can be easily simulated; the short-circuit condition can be achieved by pressing the probe onto an aluminium foil.…”

Section: Discussionmentioning

confidence: 99%

“…Fourth, Teflon (ε r ≈ 2) and CCl 4 (ε r ≈ 2.1), materials with almost constant dielectric permittivity over a broad frequency range, that are also used as reference materials, have behaviours similar to that of air and hence yield a poor calibration if air is also used (especially at low frequencies). Several other calibration procedures have been suggested and tested [118], for example utilizing a short, an open into air and a short-cavity termination [123], implementing open-end measurements of the same substance with lines of different lengths [43][44][45] or the use of artificial multi-layered feed-forwards neural networks [66]. These procedures have their own inherent problems.…”

Section: Discussionmentioning

confidence: 99%

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The co-axial aperture electromagnetic sensor and its application in material characterization

Pournaropoulos

Misra

1997

Meas. Sci. Technol.

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An open-ended co-axial line has been used as an electromagnetic sensor or probe for various industrial and scientific applications. These applications are based on the principle that the characteristics of the echo signal produced by the co-axial opening depend upon the sample material terminating the probe. Thus, if the aperture admittance (or reflection coefficient) characteristics can be precisely formulated, then the electrical parameters of the sample can be found. Several admittance models have been reported during the last two decades. A comparative study of these models is reported in this review. Furthermore, the inverse process of calculating the complex permittivity of materials is summarized.

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Section: Discussionmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

The co-axial aperture electromagnetic sensor and its application in material characterization

Pournaropoulos

Misra

1997

Meas. Sci. Technol.

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“…(1 -S22el) (1 -S11e22) -S12S21el e22 (2) and with the measured transmission coefficient of the DUT, MT2 =e30 +(1 -S22e11) (I -S11e22) -S12S21e11e22…”

Section: Introductionmentioning

confidence: 94%

“…The following six equations are used to replace level handheld programmable calculator. The first program has been fully discussed by many authors previously [2], [3], [9]; a brief discussion of this program follows.…”

Section: Introductionmentioning

confidence: 99%

A Simplified Error Model for Accurate Measurement of High-Frequency Transistor S Parameters

1985

IEEE Trans. Instrum. Meas.

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This paper presents a simplified error model for error correction for the measurement of S parameters in high-frequency transistors. The simplification process involves zero order approximation of the transistor parameters S21 and S12, and a one time, rather than successive iteration, approximation of the reflection parameters Si, and S22. The simplified error model can be programmed within the capacity of a medium level handheld programmable calculator.

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“…; the actual and the measured scattering matrices. With the notation introduced in (1) the relatilon: be.tween S and S is: §-S A +BSPx(I PDX)Fc (2) where, I is the 2x2 'identity matrix. We search for a cal'ibration procedure by which the necessary informati'on for inverting (2) Using the calibration results expressed in (3) and (4) …”

Section: Calibratton With Reciprocal Elementsmentioning

confidence: 99%

On the Exact S-Parameter Measurement of Active Devices

Baranyi¹,

Ladvánszky²

1980

10th European Microwave Conference, 1980

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The accuracy of the S-parameter measurements have been analyzed in several publications based on the assumption that the errors can be represented by a 4-port connected between the ideal test set and the-device to b-e-me-asured. Conditions are given under which the 4-port representation is justified. It is shown that-for actieve device-measurements both reciprocal and nonreciprocal calilbrating elements may be necessary. Further conditions: ar-e formulated for the practical case-when only reciprocal calibrating elements are available. Based on the theoretical results a calibration and error correction algorithm is presented.

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Calibration of microwave network analyser for computer-corrected S parameter measurements

Cited by 15 publications

References 1 publication

The co-axial aperture electromagnetic sensor and its application in material characterization

The co-axial aperture electromagnetic sensor and its application in material characterization

A Simplified Error Model for Accurate Measurement of High-Frequency Transistor S Parameters

On the Exact S-Parameter Measurement of Active Devices

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