Calibration of polar Kerr rotation and ellipticity measurements

Abstract

Kerr rotation, theta K and ellipticity in K of magnetic thin films are measured using an optical set-up including a photoelastic modulator in series with a Babinet-Soleil compensator (phase shift gamma ) and an analyser (adjustable orientation beta ). According to Jones matrix analysis two equivalent calibration procedures of the theta K and in K values are proposed. In one method these may be determined by controlled tuning of beta and gamma respectively in the conventional compensation mode. On the other hand, in a novel two-angle method, they directly emerge from intensity ratios recorded at two distinct settings of beta and gamma respectively. Exemplary data on alloyed films of MnBi(Al,Si) are presented.

Morphology and capping effects in the magnetic and magneto-optical properties of nanoparticulate Co films

“…Details of the technique can be found elsewhere. 11 The magnetic characterization of the samples with XMCD was performed by x-ray absorption spectroscopy ͑XAS͒ in total electron-yield mode on beamline 5U.1 of the Synchrotron Radiation Source ͑SRS͒ at Daresbury, UK. All XMCD measurements were performed at RT using an eight-pole vector magnet which can provide magnetic fields up to Ϯ0.9 T. The results presented here were measured while applying the magnetic field parallel to the incident x-ray beam and reversing its direction at each photon energy point.…”

Perpendicular magnetic anisotropy in chemically disordered FePd–FeV(100) alloy thin films

“…Moreover, polar Kerr spectra were measured in a spectrometer similar to the one described in Ref. 20, in the spectral range from 1.4 to 4.3 eV.…”

Generalized theory and application of Stokes parameter measurements made with a single photoelastic modulator

“…On account of its high sensitivity, wide spectral range, and high precision phase modulation, the PEM has figured prominently in a wide range of physical measurements. [2][3][4][5][6][7][8][9] In brief, the PEM can be used in any system for which a specified polarization state must be generated or, conversely, for the analysis of the polarization states of any given light beam.…”