Calibration of sampling oscilloscopes with high-speed photodiodes

Clement, T.S.; Hale, Paul D.; Williams, Dylan F.; Wang, C.M.; Dienstfrey, Andrew; Keenan, Darryl A.

doi:10.1109/tmtt.2006.879135

Cited by 86 publications

(37 citation statements)

References 27 publications

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“…Calibration of the comb generator system is performed with a calibrated sampling oscilloscope [12] and by using procedures similar to those described in [3], [7], [13]. The system in Fig.…”

Section: Calibration Of the Comb Generator Systemmentioning

confidence: 99%

A compact millimeter-wave comb generator for calibrating broadband vector receivers

Hale

Remley

Williams

et al. 2015

2015 85th Microwave Measurement Conference (ARFTG)

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Abstract-We propose a compact and low-cost waveform source that can be used to calibrate the magnitude and phase response of vector receivers over a bandwidth as large as a few gigahertz. The generator consists of a broadband comb generator followed by a filter and amplifier. As a demonstration, we constructed and calibrated a source suitable for calibrating vector signal analyzers operating between 43 GHz and 46.5 GHz. We then used the source to characterize the response of a commercially available vector signal analyzer. We compared the result with calibrations performed with a general-purpose source.

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“…Calibration of the comb generator system is performed with a calibrated sampling oscilloscope [12] and by using procedures similar to those described in [3], [7], [13]. The system in Fig.…”

Section: Calibration Of the Comb Generator Systemmentioning

confidence: 99%

A compact millimeter-wave comb generator for calibrating broadband vector receivers

Hale

Remley

Williams

et al. 2015

2015 85th Microwave Measurement Conference (ARFTG)

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“…This device will be used in conjunction with a characterized photodiode and sampling oscilloscope [11] to calibrate a down-converter.…”

Section: Methodsmentioning

confidence: 99%

Characterizing a noninsertable directional device using the NIST uncertainty framework

Jargon

Williams

Hale

et al. 2014

83rd ARFTG Microwave Measurement Conference

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-We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of a chain of components, including a coaxial-towaveguide adapter, a waveguide band-pass filter, a waveguide low-noise amplifier, a waveguide isolator, and a waveguide taper. With the aforementioned directional components, the wellknown adapter removal technique is not adequate on its own for characterizing our device. In this paper, we describe and implement our method, and propagate the uncertainties from the two required calibrations to the characterized device.

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“…The NIST procedure includes impedance mismatch correction and is thus useful for calibrating the comb generators used to calibrate NVNAs. The NIST calibration procedure [21,22] is outlined in Figure 8. …”

Section: (B) Calibration Techniquesmentioning

confidence: 99%

Practical applications of nonlinear measurements

Remley¹

2009

2009 73rd ARFTG Microwave Measurement Conference

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We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.

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Calibration of sampling oscilloscopes with high-speed photodiodes

Cited by 86 publications

References 27 publications

A compact millimeter-wave comb generator for calibrating broadband vector receivers

A compact millimeter-wave comb generator for calibrating broadband vector receivers

Characterizing a noninsertable directional device using the NIST uncertainty framework

Practical applications of nonlinear measurements

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